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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2015-07-09
16:40
Tokyo Kikai-Shinko-Kaikan Bldg. Feasibility of Fault Injection Time Estimation Using EM Leakage from Cryptographic Devices
Ko Nakamaura (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2015-43
 [more] EMCJ2015-43
pp.73-78
EMCJ 2014-07-10
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information
Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-23
The intentional electromagnetic interference (IEMI) fault-injection method using continuous sine waves causes random-byt... [more] EMCJ2014-23
pp.37-42
EMCJ, IEE-EMC 2014-06-20
11:00
Hyogo Kobe Univ. Identification Method of Fault-injected Timing on Cryptographic Devices Using Side-channel Information
Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-11
This paper describes a new technique to choose faulty ciphertexts available for Differential Fault Analysis (DFA) from t... [more] EMCJ2014-11
pp.7-12
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