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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, VLD 2007-03-09
08:40
Okinawa Mielparque Okinawa Easily Testable Multiplier with 4-2 Adder Tree
Nobutaka Kito, Kensuke Hanai, Naofumi Takagi (Nagoya Univ.)
The growth of the scale of VLSI designs makes test cost of VLSI chips expensive. Techniques of test cost reduction are r... [more] VLD2006-140 ICD2006-231
pp.1-6
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