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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 16件中 1~16件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, EMD, WPT, PEM
(Joint) [detail]
2019-07-19
10:35
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Measurement of transient electric-fields caused by ESD between spherical electrodes using broadband optical electric-field sensor
Shinobu Ishigami, Ken Kawamata, Shigeki Minegishi (TGU), Osamu Fujiwara (UEC)
 [more]
EMCJ 2018-07-27
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurement of discharge current using shielded-loop probe caused by ESD in spherical electrodes.
Masato Oikawa, Kento Kato, Shinobu Ishigami, Ken Kawamata, Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2018-28
The relationship between the electromagnetic radiation intensity accompanying the spherical electrode ESD and the peak d... [more] EMCJ2018-28
pp.37-42
EMCJ, WPT
(Joint)
2016-01-29
13:05
Kumamoto Kumamoto National Colle. Technology Influence of Surface Roughness of Electrode in EM Radiation Caused by Micro Gap ESD
Kenichiro Abe, Ken Kawamata, Shigeki Minegishi (TGU), Osamu Fujiwara (NIT) EMCJ2015-118
Impulsive electromagnetic noise is caused by ESD. Especially, micro gap discharge of less than 1kV produces GHz band wid... [more] EMCJ2015-118
pp.83-86
EMCJ, EST 2014-09-12
13:25
Hokkaido Kitami Inst. Technology Development and accuracy verification of measurement system for spark length due to electrostatic discharge from ESD-gunerator
Yoshinori Taka (KNCT), Ken Kawamata (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2014-37 EST2014-51
It has widely been accepted that the faster the approach speed of electrostatic discharge generators (ESD guns) is, the ... [more] EMCJ2014-37 EST2014-51
pp.35-39
EMCJ, IEE-EMC 2011-10-28
10:35
Aomori Hachinohe Grand Hotel Variations of radiated electromagnetic field due to low voltage ESD in spherical electrode.
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (TGU), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2011-81
Amplitude properties of radiated electromagnetic field caused by low voltage ESD (electrostatic discharge) in spherical ... [more] EMCJ2011-81
pp.1-4
EMCJ
(2nd)
2010-05-28
14:00
Miyagi Cyberscience Center, Tohoku University Measurement of the radiated electromagnetic filed intensity using spherical electrodes and a horn antenna
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT)
The micro-gap discharge as the low voltage ESD shows very fast transition duration of about 32 ps or less. Besides, brea... [more]
EMCJ 2010-04-23
14:35
Tokyo Kikai-Shinko-Kaikan Bldg. Wideband Measurement of Radiated Electromagnetic Field Intensity due to the low voltage ESD
Ken Kawamata (HIT), Shigeki Minegishi (TGU), Osamu Fujiwara (NIT) EMCJ2010-9
The breakdown voltage and radiated electromagnetic field intensity due to micro gap discharge were examined in experimen... [more] EMCJ2010-9
pp.45-48
EMCJ, IEE-EMC 2009-12-18
14:15
Gifu NIFS Study on Radiated Electromagnetic Field Intensity due to Micro Gap Discharge as the low voltage ESD.
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.)
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] EMCJ2009-95
pp.59-64
AP 2009-09-04
14:50
Aomori Hachinohe Inst. of Tech. Experimental Study of Radiated Electromagnetic Field Intensity due to Micro Gap Discharge
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) AP2009-100
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] AP2009-100
pp.121-124
EMD, EMCJ 2009-05-22
14:15
Tokyo Kanda camupus, Nippon Institute of Technology Relation Between Radiated Electromagnetic Field Intensity and Electrode Condition due to Micro Gap Discharge
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-17 EMD2009-9
he relationship between breakdown field strength and radiated electromagnetic field intensity was examined in experiment... [more] EMCJ2009-17 EMD2009-9
pp.45-48
EMCJ 2008-11-21
11:10
Tokyo AIST Tokyo Waterfront A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable.
Ken Kawamata (Hachinohe Institute of Technology), Yoshinori Taka (Nagoya Institute of Technology), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-82
The very fast transients due to micro-gap discharges as low voltage electrostatic discharges (ESDs) were investigated in... [more] EMCJ2008-82
pp.45-48
EMCJ, EMD 2008-07-18
14:40
Tokyo Kikai-Shinko-Kaikan Bldg Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2008-45 EMD2008-27
Abstract Relationship between breakdown field strength and radiated electromagnetic field strength was examined in expe... [more] EMCJ2008-45 EMD2008-27
pp.27-30
EMCJ, MW 2007-10-26
13:30
Miyagi Tohoku University Estimation of Transition Duration due to Discharge from Measured Waveforms in Bandwidth-limited.
Yoshinori Taka (NIT), Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2007-73 MW2007-120
The voltage and current transition duration due to small gap discharge as the low voltage ESD was investigated in time d... [more] EMCJ2007-73 MW2007-120
pp.111-115
EMCJ 2006-12-15
15:00
Aichi Nagoya Institute of Technology Examination of the gap length characteristics due to micro gap discharge in voltage bellow 1000V.
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2006-92
The voltage and current transition duration due to small gap discharge as the low voltage ESD was investigated in time d... [more] EMCJ2006-92
pp.65-69
EMCJ, MW 2006-10-26
09:40
Aomori Hachinohe Institute of Technology 12GHz Measurement of voltage and current rise time due to micro gap discharge.
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2006-51 MW2006-107
The voltage and current rise time due to small gap discharge as the low voltage ESD was investigated in time domain. The... [more] EMCJ2006-51 MW2006-107
pp.1-5
EMCJ 2004-12-10
13:25
Aichi Nagoya Institute of Technology Measurement of frequency spectra of transient voltage due to micro gap discharge
Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.)
 [more] EMCJ2004-109
pp.41-45
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