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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 17 of 17  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
CS 2021-07-16
10:35
Online Online A system development for flexibly IoT device sharings among IoT services
Keisuke Takahashi, Kenji Kanai, Hidenori Nakazato (Waseda Univ.), Kenichi Nakamura (PANASONIC) CS2021-34
 [more] CS2021-34
pp.80-81
IE, CS, IPSJ-AVM, ITE-BCT [detail] 2020-11-26
14:10
Online Online Proposal of IoT meta data management protocols for efficient IoT data sharing and IoT service deployment
Keisuke Takahashi, Hidenori Nakazato, Kenji Kanai (Waseda Univ.) CS2020-67 IE2020-26
This paper proposes Catalog Server and its various protocols for efficient IoT meta data management. The Catalog Server ... [more] CS2020-67 IE2020-26
pp.13-18
CS, CAS 2020-02-27
09:55
Kumamoto   Data acquisition and sharing method for devices connected to Fed4IoT applications
Keisuke Takahashi, Hidenori Nakazato, Kenji Kanai (Sou Univ.) CAS2019-100 CS2019-100
 [more] CAS2019-100 CS2019-100
pp.13-18
EMD 2013-05-17
15:55
Hokkaido Chitose Arcadia Plaza Observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces during switching operations
Makoto Hasegawa, Keisuke Takahashi, Daichi Kawamura, Yuya Hirano (Chitose Inst. of Science and Tech.) EMD2013-6
An evaluation system enabling observation and evaluation of changes on contact surface conditions (growth of a crater an... [more] EMD2013-6
pp.29-34
EMD 2013-03-01
15:35
Saitama Nippon Institute of Technology Damage shape evaluation system of electrical contacts and investigation of material transfer and erosion phenomena
Keisuke Takahashi, Daichi Kawamura, Yuya Hirano, Makoto Hasegawa (Chitose Inst. of Science and Tech.) EMD2012-118
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2012-118
pp.37-40
EMD 2013-01-25
15:50
Kanagawa Hitachi, Ltd., (Totsuka, Yokohama) An experimental study on a 3-D shape observation system of a sample by employing a laser displacement sensor
Makoto Hasegawa, Daichi Kawamura, Keisuke Takahashi (Chitose Inst. of Science and Tech.) EMD2012-100
For the purpose of observing and evaluating damaged shapes due to material transfer and erosion, caused by arc discharge... [more] EMD2012-100
pp.15-19
EMD 2012-11-30
14:10
Chiba Chiba Institute of Technology Observation of growth of arc damages on Ag and AgSnO2 contact surfaces during switching operations
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Tech.) EMD2012-69
An evaluation system for contact surface damages is being constructed so as to realize observation of a changing process... [more] EMD2012-69
pp.31-36
EMD 2012-10-19
15:15
Tokyo Fuji Electric FA Components & Systems Co., Ltd. Three dimensional evaluation of arc damages on Ag and AgSnO2 contact surfaces
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) EMD2012-63
Material transfer and erosion caused by arc discharges during operations of mechanical relays and switches is one of cri... [more] EMD2012-63
pp.19-24
EMD 2012-05-25
15:50
Miyagi Tohoku Bunka Gakuen Univ. An experimental study on an optical measurement system for damages on contact surfaces (II)
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) EMD2012-6
For the purpose of realizing, during switching operations, observation and evaluation of growth processes of a crater an... [more] EMD2012-6
pp.27-30
EMD, R 2012-02-17
11:25
Kyoto   An experimental study on an optical measurement system for damages on contact surfaces
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) R2011-44 EMD2011-118
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] R2011-44 EMD2011-118
pp.13-18
EMD 2011-11-17
16:50
Akita Akita Univ. Tegata Campus An Experimental Study on Evaluation of Contact Surface Damages with an Optical Cross-Section Method
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science & Tech.) EMD2011-84
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2011-84
pp.91-96
ICD, IE, SIP, IPSJ-SLDM [detail] 2011-10-25
10:20
Miyagi Ichinobo(Sendai) A method for accurate estimation of venous shapes from small picture signals.
Koji Kashihara, Keisuke Takahashi, Momoyo Ito, Minoru Fukumi (Tokushima Univ.) SIP2011-70 ICD2011-73 IE2011-69
 [more] SIP2011-70 ICD2011-73 IE2011-69
pp.49-54
EMD 2011-10-21
13:00
Tokyo Tachikawa-Shiminn-kaikan An experimental study on evaluation of changes in contact surface profiles with an optical cross-section method during breaking operations of a DC inductive load current
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2011-58
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2011-58
pp.7-12
EMD 2011-05-20
15:00
Miyagi Tohoku Univ. Cyber-Science Center An experimental study on an evaluation system of a contact surface profile with an optical cross-section method (II)
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2011-5
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2011-5
pp.21-26
EMD 2011-03-04
16:00
Saitama Nippon Institute of Technology An experimental study on an evaluation system of a contact surface profile with an optical cross-section method
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci & Tech.) EMD2010-165
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2010-165
pp.53-56
EE 2009-07-30
13:25
Shimane   An Easy Add-on Energy Recovery System for Motor Drive Systems
Keisuke Takahashi, Eiji Hiraki, Toshihiko Tanaka (Yamaguchi Univ.), Tetsuo Matsuda (Ube Machinery Co.,LTD.) EE2009-8
The regenerative energy from the motor drive systems used in the injection molding is consumed by resistors connected on... [more] EE2009-8
pp.7-12
SDM, ED 2009-02-27
09:00
Hokkaido Hokkaido Univ. Fabrication of single-Electron Transistors Using Field-Emission-Induced Electromigration
Yusuke Tomoda, Watari Kume, Michinobu Hanada, Keisuke Takahashi, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2008-232 SDM2008-224
We report a simple and easy technique for the fabrication of single-electron transistors (SETs) consisted of nanogaps wi... [more] ED2008-232 SDM2008-224
pp.47-52
 Results 1 - 17 of 17  /   
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