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Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, ED, CPM 2008-11-28
10:50
Aichi Nagoya Institute of Technology Two-Dimensional Analysis of Field-Plate Effects on Buffer-Related Lag Phenomena and Current Collapse in AlGaN/GaN HEMTs
Atsushi Nakajima, Keiichi Itagaki, Kazushige Horio (Shibaura Inst. Tech.) ED2008-173 CPM2008-122 LQE2008-117
 [more] ED2008-173 CPM2008-122 LQE2008-117
pp.103-108
ED, MW 2008-01-16
13:00
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Field-Plate Effects on Buffer-Related Current Collapse in GaN-Based FETs
Keiichi Itagaki, Atsushi Nakajima, Kazushige Horio (Shibaura Inst. Tech.) ED2007-206 MW2007-137
 [more] ED2007-206 MW2007-137
pp.1-5
ED, MW 2006-01-19
10:20
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Slow Current Transients and Current Collapse in GaN FETs
Hiroki Takayanagi, Keiichi Itagaki, Hiroyuki Nakano, Kazushige Horio (Shibaura Inst. Tech.)
Two-dimensional transient analyses of GaN MESFETs are performed in which a deep donor and a deep acceptor in a semi-insu... [more] ED2005-199 MW2005-153
pp.1-6
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