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Committee Date Time Place Paper Title / Authors Abstract Paper #
RCC, ISEC, IT, WBS 2023-03-15
15:20		 Yamaguchi
(Primary: On-site, Secondary: Online)		 Evaluation and Improvement of Related Key Differential Attack for the Block Cipher Midori
Shion Hirao, Keigo Horibe, Kosei Sakamoto, Takanori Isobe (UOH) IT2022-132 ISEC2022-111 WBS2022-129 RCC2022-129		  [more] IT2022-132 ISEC2022-111 WBS2022-129 RCC2022-129
pp.404-411
DC 2011-02-14
13:45		 Tokyo Kikai-Shinko-Kaikan Bldg. Test Pattern Generation for Highly Accurate Delay Testing
Keigo Hori (NAIST), Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (NAIST/JST) DC2010-64		 We propose a new faster-than-at-speed test method to detect small delay defects. As semiconductor technology is scaling ... [more] DC2010-64
pp.33-38
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