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Committee Date Time Place Paper Title / Authors Abstract Paper #
RECONF, VLD 2024-01-30
13:20		 Kanagawa AIRBIC Meeting Room 1-4
(Primary: On-site, Secondary: Online)		 Reduction of Circuit Size by Optimizing Status Registers in Full Hardware RTOS-Based Systems
Kei Mikami, Nagisa Ishiura (Kansei Gakuin Univ.), Hiroyuki Tomiyama (Ritsumeikan Univ.), Hiroyuki Kanbara (ASTEM) VLD2023-94 RECONF2023-97		 This article presents a technique for handling increased number of tasks by reducing both circuit size and critical path... [more] VLD2023-94 RECONF2023-97
pp.81-86
IN 2017-01-19
13:10		 Aichi   A Consideration of a Network Management Method Using a Network Ontology Bonsai
Kei Mikami, Shinji Kawaguchi, Ryota Ohshima, Kenta Shimamatsu, Takao Kondo (Keio Univ.), Osamu Kamatani, Osamu Akashi (NTT), Kunitake Kaneko, Fumio Teraoka (Keio Univ.) IN2016-86		  [more] IN2016-86
pp.7-12
IN, IA
(Joint)		 2015-12-18
13:20		 Hiroshima Hiroshima City University Using a Multi-domain Authentication and Authorization Infrastructure Yamata-no-Orochi in a Distributed Storage System Content Espresso
Kei Mikami, Daisuke Ando, Kunitake Kaneko, Fumio Teraoka (Keio Univ.) IN2015-88		 Currently, every internet service has its own authentication and authorization mechanism, and ev- ery service domain man... [more] IN2015-88
pp.101-106
SDM, ED 2011-02-24
10:45		 Hokkaido Hokkaido Univ. Electrical Characteristics of Si Single-Electron Transistor with Single-Carrier Trap Formed by Photo-Irradiation
Michito Shinohara, Yuki Kato, Kei Mikami, Masashi Arita (Hokkaido Univ), Akira Fujiwara (NTT), Yasuo Takahashi (Hokkaido Univ) ED2010-203 SDM2010-238		 It is well known that step-like current jumps are observed when huge vertical electric field are applied to a Si single-... [more] ED2010-203 SDM2010-238
pp.63-66
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