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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HIP |
2019-10-31 16:00 |
Kyoto |
Kyoto Terrsa |
Blanking Effect in Saccadic Suppression of Image Displacement
-- The Effects of Blank Duration and Onset Time -- Yasuaki Tamada, Kazuya Hara, Ken Kitano, Masayuki Sato (The Univ. of Kitakyushu) HIP2019-64 |
Target displacements during saccades are harder to be noticed than those during fixations (Saccadic Suppression of Image... [more] |
HIP2019-64 pp.79-82 |
ED, CPM, SDM |
2015-05-28 16:05 |
Aichi |
Venture Business Laboratory, Toyohashi University of Technology |
Schottky barrier diodes of high mobility β-Ga2O3 (-201) single crystals grown by edge-defined-fed growth method Yuta Koga, Kazuya Harada, Kenji Hanada, Toshiyuki Oishi, Makoto Kasu (Saga Univ.) ED2015-22 CPM2015-7 SDM2015-24 |
High Hall electron mobility and its high performances of Schottky barrier diodes on edge-defined film-fed grown (2 ̅... [more] |
ED2015-22 CPM2015-7 SDM2015-24 pp.31-34 |
ED, CPM, SDM |
2015-05-28 17:05 |
Aichi |
Venture Business Laboratory, Toyohashi University of Technology |
Device simulation of NO2-exposed H-terminated diamond FETs with Al2O3 insulator Toshiyuki Oishi, Ryutaro Higashi, Kazuya Harada, Yuta Koga (Saga Univ.), Kazuyuki Hirama (NTT), Makoto Kasu (Saga Univ.) ED2015-24 CPM2015-9 SDM2015-26 |
This paper investigated the simulation model for NO2-exposed H-terminated diamond FETs with Al2O3 insulator gate, which ... [more] |
ED2015-24 CPM2015-9 SDM2015-26 pp.41-44 |
COMP |
2006-10-17 14:50 |
Miyagi |
Tohoku University |
A Randomness Based Analysis on the Data Size Needed for Generating Reliable Rules Kazuya Haraguchi (Kyoto Univ.), Mutsunori Yagiura (Nagoya Univ.), Endre Boros (Rutgers Univ.), Toshihide Ibaraki (Kwansei Gakuin Univ.) |
We consider a two-labeled data set $X=X_1\cup X_0$ in which each xample is a Boolean vector. A pattern is a co-occurrenc... [more] |
COMP2006-38 pp.57-64 |
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