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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 60  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
RECONF, VLD 2024-01-29
14:40
Kanagawa AIRBIC Meeting Room 1-4
(Primary: On-site, Secondary: Online)
VLD2023-85 RECONF2023-88 We are developing a signal processing ASIC designed to operate at extremely low temperatures with the goal of realizing ... [more] VLD2023-85 RECONF2023-88
pp.31-34
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
13:10
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Frequency Dependence of Soft Error Rates Induced by Alpha-Particle and Heavy Ion
Haruto Sugisaki, Ryuichi Nakajima, Shotaro Sugitani, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36
 [more] VLD2023-33 ICD2023-41 DC2023-40 RECONF2023-36
pp.19-24
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
13:35
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Data Pattern Dependence of the Total Ionizing Dose Effect in Floating-gate and Charge-trap TLC NAND flash memories
Taiki Ozawa, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-34 ICD2023-42 DC2023-41 RECONF2023-37
 [more] VLD2023-34 ICD2023-42 DC2023-41 RECONF2023-37
pp.25-30
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
14:00
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Evaluation of SEU Sensitivity by Alpha-Particle on PMOS and NMOS Transistors in a 65 nm bulk Process
Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38
 [more] VLD2023-35 ICD2023-43 DC2023-42 RECONF2023-38
pp.31-36
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-15
15:30
Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)
Error Correction Decoder of the Surface Code designed in a 22-nm Bulk Process for Fault Torelant Quantum Computers
Ren Aoyama (KIT), Junichiro Kadomoto (UTokyo), Kazutoshi Kobayashi (KIT) VLD2023-38 ICD2023-46 DC2023-45 RECONF2023-41
Error correction is mandatory to realize a quantum computer that can perform practical calculations.
Surface codes is... [more]
VLD2023-38 ICD2023-46 DC2023-45 RECONF2023-41
pp.49-53
ICD 2023-04-10
09:55
Kanagawa
(Primary: On-site, Secondary: Online)
[Invited Lecture] Nonvolatile Storage Cells Using FiCC for IoT Processors with Intermittent Operations
Yuki Abe, Kazutoshi Kobayashi (KIT), Jun Shiomi (Osaka Univ.), Hiroyuki Ochi (Ritsumeikan Univ.) ICD2023-1
Energy harvesting is a key technology to supply power for Internet of Things (IoT) devices. Computing devices for IoTs m... [more] ICD2023-1
pp.1-6
HWS, VLD 2023-03-01
11:00
Okinawa
(Primary: On-site, Secondary: Online)
Measured Evaluation of BTI Degradation in a 65nm FDSOI Process using Ring Oscillators with Same Circuit Structure
Daisuke Kikuta (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT) VLD2022-73 HWS2022-44
(To be available after the conference date) [more] VLD2022-73 HWS2022-44
pp.1-6
IPSJ-SLDM, RECONF, VLD [detail] 2023-01-24
10:30
Kanagawa Raiosha, Hiyoshi Campus, Keio University
(Primary: On-site, Secondary: Online)
Measurement results of soft error tolerance of LPDDR4 SDRAM and GDDR5 SDRAM
Motoki Kamibayashi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Masanori Hashimoto (Kyoto Univ.) VLD2022-65 RECONF2022-88
In recent years, as the memory capacity of computer systems has increased,the reliability of the system has decreased.So... [more] VLD2022-65 RECONF2022-88
pp.34-39
VLD, HWS [detail] 2022-03-07
14:05
Online Online Measurement Results of Nonvolatile Flip-Flops Using FiCC for IoT Processors with Intermittent Operations
Yuki Abe, Kazutoshi Kobayashi (KIT), Hiroyuki Ochi (Ritsumeikan Univ.) VLD2021-85 HWS2021-62
In recent years, with the spread of the Internet of Things (IoT) and mobile devices, low power consumption of processors... [more] VLD2021-85 HWS2021-62
pp.45-50
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2021-12-01
09:20
Online Online Soft Errors on Flip-flops Depending on Circuit and Layout Structures Estimated by TCAD Simulations
Moeka Kotani, Ryuichi Nakajima (KIT), Kazuya Ioki (ROHM), Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25
We compare the soft error tolerance of conventional flip-flops (FFs) and the proposed radiation-hard FF with small area,... [more] VLD2021-17 ICD2021-27 DC2021-23 RECONF2021-25
pp.1-6
SIP, CAS, VLD, MSS 2021-07-05
13:30
Online Online [Panel Discussion] [Panel Discussion] The Role of System and Signal Processing Subsociety -- Challenge to IoT (Internet of Things) issues --
Hideaki Okazaki (SIT), Hiroki Sato (SONY), Kazutoshi Kobayashi (KIT), Atsuo Ozaki (OIT), Kazunori Hayashi (KU), Toshihisa Tanaka (TUAT) CAS2021-4 VLD2021-4 SIP2021-14 MSS2021-4
The four technical committees (TCs) of Systems and Signal Processing sub-society, i.e., TCs of Circuits
and Systems (CA... [more]
CAS2021-4 VLD2021-4 SIP2021-14 MSS2021-4
pp.16-18
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
09:30
Online Online Design of Nonvolatile SRAM Using SONOS Flash Cell and its Evaluation by Circuit Simulation
Takaki Urabe, Koji Nii, Kazutoshi Kobayashi (KIT) VLD2020-11 ICD2020-31 DC2020-31 RECONF2020-30
In this paper, we designed a layout of a nonvolatile SRAM memory using the SONOS Flash memory, and investigated its char... [more] VLD2020-11 ICD2020-31 DC2020-31 RECONF2020-30
pp.1-5
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-18
14:00
Online Online Measurement Results of Total Ionizing Dose Effect on Ring Oscillators Fabricated by a Thin-BOX FDSOI Process for Outer-space Mission
Takashi Yoshida, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49
The Total Ionizing Dose (TID) effect is one of the major concerns for semiconductor devices in outer space, where high a... [more] VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49
pp.110-114
IPSJ-SLDM, RECONF, VLD, CPSY, IPSJ-ARC [detail] 2020-01-24
15:25
Kanagawa Raiosha, Hiyoshi Campus, Keio University Measuring SER by Neutron Irradiation Between Volatile SRAM-based and Nonvolatile Flash-based FPGAs
Yuya Kawano, Yuto Tsukita, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2019-90 CPSY2019-88 RECONF2019-80
 [more] VLD2019-90 CPSY2019-88 RECONF2019-80
pp.217-222
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-14
09:15
Ehime Ehime Prefecture Gender Equality Center NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement
Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.) VLD2019-35 DC2019-59
In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on ... [more] VLD2019-35 DC2019-59
pp.57-62
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
14:10
Hiroshima Satellite Campus Hiroshima Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller
Hiroki Nakano (KIT), Ryo Kishida (TUS), Jun Furuta, Kazutoshi Kobayashi (KIT) CPM2018-95 ICD2018-56 IE2018-74
 [more] CPM2018-95 ICD2018-56 IE2018-74
pp.31-36
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
13:45
Hiroshima Satellite Campus Hiroshima A Radiation-hard Low-delay Flip-Flop with Stacking Structure for SOI Process
Mitsunori Ebara, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2018-69 DC2018-55
 [more] VLD2018-69 DC2018-55
pp.203-208
SDM, ICD, ITE-IST [detail] 2018-08-07
11:30
Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) SDM2018-28 ICD2018-15
(To be available after the conference date) [more] SDM2018-28 ICD2018-15
pp.15-20
VLD, HWS
(Joint)
2018-02-28
17:20
Okinawa Okinawa Seinen Kaikan Evaluation of a Radiation-Hardened Method and Soft Error Resilience on Stacked Transistors in 28/65 nm FDSOI Processes
Haruki Maruoka, Kodai Yamada, Mitsunori Ebara, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-103
The continuous downscaling of transistors has resulted in an increase of reliability issues for semiconductor chips. In ... [more] VLD2017-103
pp.85-90
VLD, HWS
(Joint)
2018-02-28
17:45
Okinawa Okinawa Seinen Kaikan Evaluation of Soft Error Tolerance on Flip-Flop depending on 65 nm FDSOI Transistor Threshold-Voltage
Mitsunori Ebara, Haruki Maruoka, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2017-104
Moore's Law has been miniaturizing integrated circuits, which
can make a lot of high performance devices such as PCs an... [more]
VLD2017-104
pp.91-96
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