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Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM 2010-10-28
Nagano   Structure and electric properties of RF-sputtered p-type nickel oxide thin films
Atsushi Nagata, Kazuo Uchida, Atsushi Koizumi, Hiroshi Ono, Shinji Nozaki (UEC) CPM2010-96
NiOx as a transparent oxide semiconductor has been known long to show an intrinsic p-type conductivity although most of ... [more] CPM2010-96
ED, MW 2008-01-17
Tokyo Kikai-Shinko-Kaikan Bldg. Improvement in reliability of InGaP/GaAs HBT's by ledge passivation
Fu-Ying Yang, Shinji Nozaki, Kazuo Uchida, Atsushi Koizumi (UEC) ED2007-217 MW2007-148
Because of the exposed heavily carbor-doped GaAs base in the InGaP/GaAs HBT’s, the current gain is significantly reduced... [more] ED2007-217 MW2007-148
ED, MW 2006-01-18
Tokyo Kikai-Shinko-Kaikan Bldg. Effects of surface recombination on dc characteristics of InGaP/GaAs heterojunction bipolar transistors(HBT’s)
Airi Kurokawa, Zhi Jin, Hiroshi Ono, Kazuo Uchida, Shinji Nozaki, Hiroshi Morisaki (UEC)
 [more] ED2005-198 MW2005-152
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