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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2018-04-20 13:50 |
Tokyo |
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[Invited Talk]
Memory LSI using crystalline oxide semiconductor FET Jun Koyama, Takako Seki, Yuto Yakubo, Satoru Ohshita, Kazuma Furutani, Takahiko Ishizu, Tomoaki Atsumi, Yoshinori Ando, Daisuke Matsubayashi, Kiyoshi Kato, Takashi Okuda (SEL), Masahiro Fujita (The Univ. of Tokyo), Shunpei Yamazaki (SEL) ICD2018-12 |
FETs fabricated with a c-axis aligned crystalline In-Ga-Zn oxide semiconductor (CAAC-IGZO) have an extremely low off-sta... [more] |
ICD2018-12 pp.47-52 |
ICD |
2015-04-17 10:50 |
Nagano |
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[Invited Talk]
A 128kb 4bit/cell Nonvolatile Memory with Crystalline In-Ga-Zn Oxide FET Using Vt Cancel Write Method Takanori Matsuzaki, Tatsuya Onuki, Shuhei Nagatsuka, Hiroki Inoue, Takahiko Ishizu, Yoshinori Ieda, Masayuki Sakakura, Tomoaki Atsumi, Yutaka Shionoiri, Kiyoshi Kato, Takashi Okuda, Yoshitaka Yamamoto (SEL), Masahiro Fujita (The Univ. of Tokyo), Jun Koyama, Shunpei Yamazaki (SEL) ICD2015-9 |
A 128kbit 4bit/cell memory is achieved by a nonvolatile oxide semiconductor RAM test chip with a c-axis aligned crystall... [more] |
ICD2015-9 pp.39-44 |
ICD, SDM |
2014-08-04 15:45 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
[Invited Talk]
A 32-bit CPU with Zero Standby Power and 1.5-clock Backup/2.5-clock Restore Achieved by Utilizing a 180-nm Crystalline Oxide Semiconductor Transistor Jun Koyama, Atsuo Isobe, Hikaru Tamura, Kiyoshi Kato, Takuro Ohmaru, Wataru Uesugi, Takahiko Ishizu, Kazuaki Ohshima, Yasutaka Suzuki, Naoaki Tsutsui, Tomoaki Atsumi, Yutaka Shionoiri, Yukio Maehashi (SEL), Masahiro Fujita (Univ. of Tokyo), Shunpei Yamazaki (SEL) SDM2014-70 ICD2014-39 |
A flip-flop achieving high-speed backup utilizing a Si transistor and long-term retention with zero standby power by mea... [more] |
SDM2014-70 ICD2014-39 pp.45-50 |
PRMU, SP |
2012-02-09 13:00 |
Miyagi |
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Fault Classification Based on Likelihood Profile Feature Takuya Mikami, Masashi Ando, Jun Koyama, Seiji Hotta (TUAT), Hisae Shibuya, Shunji Maeda (HITACHI) PRMU2011-192 SP2011-107 |
In this paper, we propose a feature called likelihood profile for classifying fault events of a precision machine. This ... [more] |
PRMU2011-192 SP2011-107 pp.37-40 |
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