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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2024-04-12 14:55 |
Kanagawa |
(Primary: On-site, Secondary: Online) |
[Invited Lecture]
遠端ビット線プリチャージとウィークビットトラッキング回路を用いて0.48 - 1.2V動作電圧範囲と27.6Mbit/mm^2の高集積密度を実現する3ナノメートルSRAM Yumito Aoyagi, Makoto Yabuuchi, Tomotaka Tanaka, Yuichiro Ishii, Yoshiaki Osada, Takaaki Nakazato, Koji Nii, Isabel Wang, Yu-Hao Hsu, Hong-Chen Cheng, Hung-Jen Liao, Tsung-Yung Jonathan Chang (TSMC) |
[more] |
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ICD |
2024-04-12 15:20 |
Kanagawa |
(Primary: On-site, Secondary: Online) |
[Invited Lecture]
3.7-GHz Multi-Bank High-Current Single-Port Cache SRAM with 0.5V-1.4V Wide Voltage Range Operation in 3nm FinFET for HPC Applications Yoshiaki Osada, Takaaki Nakazato, Koji Nii, Jhon-Jhy Liaw, Shien-Yang Michael Wu, Quincy Li, Hidehiro Fujiwara, Hung-Jen Liao, Tsung-Yung Jonathan Chang (TSMC) |
[more] |
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ICD |
2024-04-12 15:45 |
Kanagawa |
(Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 3nm-FinFET 4.3 GHz 21.1 Mb/mm2 Double-Pumping 1-Read and 1-Write Pseudo-2-Port SRAM with a Folded-Bitline Multi-Bank Architecture Masaru Haraguchi, Yorinobu Fujino, Yoshisato Yokoyama, Ming-Hung Chang, Yu-Hao Hsu, Hong-Chen Cheng, Koji Nii, Yih Wang, Tsung-Yung Jonathan Chang (TSMC) |
[more] |
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ICD |
2023-04-11 09:55 |
Kanagawa |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
A 4-nm 6163-TOPS/W/b 4790-TOPS/mm2/b SRAM based Digital-Computing-in-Memory Macro Supporting Bit-Width Flexibility and Simultaneous MAC and Weight Update Haruki Mori, Wei-Chang Zhao, Cheng-En Lee, Chia-Fu Lee, Yu-Hao Hsu, Chao-Kai Chuang, Takeshi Hashizume, Hao-Chun Tung, Yao-Yi Liu, Shin-Rung Wu, Kerem Akarvardar, Tan-Li Chou, Hidehiro Fujiwara, Yih Wang, Yu-Der Chih, Yen-Huei Chen, Hung-Jen Liao, Tsung-Yung Jonathan Chang (TSMC) |
[more] |
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ICD |
2016-04-14 11:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A 64kb 16nm Asynchronous Disturb Current Free 2-Port SRAM with PMOS Pass-Gates for FinFET Technologies Hidehiro Fujiwara, Li-Wen Wang, Yen-Huei Chen, Koo-Cheng Lin, Dar Sun, Shin-Rung Wu, Jhon-Jhy Liaw, Chin-Yung Lin, Mu-Chi Chiang, Hung-Jen Liao, Shien-Yang Wu, Jonathan Chang (TSMC) ICD2016-4 |
[more] |
ICD2016-4 pp.17-20 |
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