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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Signal Integrity Analysis for High-speed Memory Test Interface using Data Capture PCB
Hyesoo Kim, Kyungjun Cho, Seongguk Kim, Joungho Kim (KAIST) EMCJ2018-80
In this paper, in high-speed graphic memory test interface, the trade-off relationship for electrical characteristic of ... [more] EMCJ2018-80
p.63
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