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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2013-12-13
13:25
Ishikawa   Variable Test-Timing Generation for Built-In Self-Test on FPGA
Yasuo Sato, Munehiro Matsuura, Hitoshi Arakawa, Yousuke Miyake, Seiji Kajihara (Kyushu Inst. of Tech.) DC2013-69
This paper proposes a variable test-timing generation method that should be used for built-in self-test on FPGA. Applica... [more] DC2013-69
pp.7-12
OME, SDM, ED 2007-04-20
14:15
Fukuoka   Temperature Dependence of Molecular Structure and Packing of Poly(di-hexyl silane)
Hiroshi Iino, Hitoshi Arakawa, Hidetaka Ohta, Shoji Furukawa (Kyushu Inst. Tech.) ED2007-4 SDM2007-4 OME2007-4
Recently, various electronic devices are fabricated using inorganic materials, such as, Si and GaAs. However, lots of en... [more] ED2007-4 SDM2007-4 OME2007-4
pp.17-22
CPM, EMD, OME 2006-06-30
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Structure and Physical Properties of Poly(di-methyl silane) and Poly(di-hexyl silane) Thin Films
Shoji Furukawa, Hidetaka Ohta, Hitoshi Arakawa, Takashi Yasuda, Akihiko Katsuki (Kyushu Inst. Technology)
Thin Films of poly(di-methyl silane) and poly(di-hexyl silane) have been prepared by the vacuum evaporation technique an... [more] EMD2006-13 CPM2006-37 OME2006-47
pp.45-49
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