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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 52  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SIP, BioX, IE, MI, ITE-IST, ITE-ME [detail] 2022-05-19
14:10
Kumamoto Kumamoto University Kurokami Campus
(Primary: On-site, Secondary: Online)
Needle Puncture by AR Navigation Using QR Code Recognition and Virtual Protractor
Haruya Tanaka (Waseda Univ.), Satoru Morita, Kazufumi Suzuki, Takahiro Yamamoto, Hiroshi Yamazaki (TWMUH), Shuhei Fujii, Jun Ohya (Waseda Univ.), Ken Masamune, Shuji Sakai (TWMUH) SIP2022-10 BioX2022-10 IE2022-10 MI2022-10
The purpose of this study is to develop an AR navigation system using Microsoft HoloLens2 to support puncture in imaging... [more] SIP2022-10 BioX2022-10 IE2022-10 MI2022-10
pp.55-60
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2022-03-10
10:30
Online Online A Don't Care Filling Method of Control Signals for Concurrent Logical Fault Testing
Haofeng Xu, Toshinori Hosokawa, Hiroshi Yamazaki, Masayuki Arai (Nihon Univ), Masayoshi Yoshimura (KSU) CPSY2021-56 DC2021-90
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] CPSY2021-56 DC2021-90
pp.67-72
DC 2022-03-01
15:10
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
State assignment method to improve transition fault coverage for controllers including invalid states
Kyohei Iizuka, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) DC2021-75
 [more] DC2021-75
pp.63-68
DC 2021-12-10
13:00
Kagawa
(Primary: On-site, Secondary: Online)
A Low Power Oriented Multiple Target Test Generation Method
Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] DC2021-55
pp.1-6
OFT 2021-10-14
10:30
Online Online [Poster Presentation] Amplitude responses characterization of hetero-core optical fiber accelerometer with fixed supports at both ends for low frequency vibration monitoring
Miyuki Kadokura (Soka Univ.), Hiroshi Yamazaki (CSJ), Michiko Nishiyama, Kazuhiro Watanabe (Soka Univ.) OFT2021-29
In this paper, a hetero-core optical fiber accelerometer with the weight has been evaluated with respect to acceleration... [more] OFT2021-29
pp.33-34
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2021-03-26
11:40
Online Online A Controller Augmentation method to Improving Transition Fault Coverage
Kyohei Iizuka, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) CPSY2020-63 DC2020-93
With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern VLSIs are increasin... [more] CPSY2020-63 DC2020-93
pp.79-84
PN 2021-03-01
14:30
Online Online [Invited Lecture] Wide-band WDM Inline-amplified Transmission by Optical Parametric Amplifier using PPLN Waveguides
Takayuki Kobayashi, Shimpei Shimizu, Masanori Nakamura, Takeshi Umeki, Takushi Kazama, RYoichi Kasahara, Fukutaro Hamaoka, Munehiko Nagatani, Hiroshi Yamazaki, Hideyuki Nosaka, Yutaka Miyamoto (NTT) PN2020-44
To increase the capacity of optical transmission systems, it is important to improve a spectral efficiency by utilizing ... [more] PN2020-44
pp.15-19
OPE, OCS, OFT
(Joint) [detail]
2021-02-18
14:25
Online Online Calibration of a hetero-core optical fiber three-axis accelerometer with fixed support at both ends
Sakura Kiyama, Miyuki Kadokura, Hiroshi Yamazaki, Michiko Nishiyama, Kazuhiro Watanabe (SOKA Univ.) OFT2020-57 OPE2020-77
 [more] OFT2020-57 OPE2020-77
pp.9-12
DC 2021-02-05
14:00
Online Online Multiple Target Test Generation Method using Test Scheduling Information of RTL Hardware Elements
Ryuki Asami, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2020-74
In recent years, since the test cost for large-scale integrated circuits has increased, design-for-testability methods f... [more] DC2020-74
pp.30-35
OPE, OCS, LQE 2020-10-23
10:35
Online Online [Invited Talk] Wide-band WDM Inline-amplified Transmission with PPLN-based Optical Parametric Amplifier
Takayuki Kobayashi, Shimpei Shimizu, Masanori Nakamura, Takeshi Umeki, Takushi Kazama, Ryoichi Kasahara, Fukutaro Hamaoka, Munehiko Nagatani, Hiroshi Yamazaki, Hideyuki Nosaka, Yutaka Miyamoto (NTT) OCS2020-11 OPE2020-34 LQE2020-14
In optical transmission systems, the extension of the optical-band used for wavelength division multiplexing is a promis... [more] OCS2020-11 OPE2020-34 LQE2020-14
pp.17-20
OFT 2020-10-08
09:10
Online Online [Poster Presentation] IoT monitoring system collaborated with hetero-core fiber optic sensor and Sigfox network
Shinichi Nanmatsu, Hiroshi Yamazaki, Kazuhiro Yamazaki (Soka Univ.) OFT2020-9
This paper describes fiber optic sensor IoT system which collaborates LPWA(Low-Power-Wide-Area) and hetero-core optical ... [more] OFT2020-9
pp.1-3
OFT 2020-10-09
11:10
Online Online Development of a hetero-core fiber optic strain gauge for acceleration measurement
Hiroshi Yamazaki, Kazuhiro Watanabe (Soka Univ.) OFT2020-29
 [more] OFT2020-29
pp.82-85
HWS, VLD [detail] 2020-03-06
14:30
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver
Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] VLD2019-131 HWS2019-104
pp.215-220
OCS, OFT, OPE
(Joint) [detail]
2020-02-27
13:15
Okinawa Okinawa Jichikaikan Liquid sensing on structures embedded with hetero-core fiber optics
Hiroyuki Sueyoshi, Hiroshi Yamazaki, Michiko Nishiyama, Kazuhiro Watanabe (Soka Univ.) OFT2019-59 OPE2019-98
This study aims to hetero-core fiber optic surface plasmon resonance (SPR) sensors implantable to structures for giving ... [more] OFT2019-59 OPE2019-98
pp.1-4
OCS, OFT, OPE
(Joint) [detail]
2020-02-27
14:05
Okinawa Okinawa Jichikaikan Characteristics of hetero-core fiber optic temperature sensor with Au/TiO2 island films
Koji Yuhashi, Masahiro Mikami, Hiroshi Yamazaki, Michiko Nishiyama, Shoichi Kubodera, Kazuhiro Watanabe (Soka Univ.) OFT2019-61 OPE2019-100
(Advance abstract in Japanese is available) [more] OFT2019-61 OPE2019-100
pp.9-12
DC 2020-02-26
12:00
Tokyo   A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs
Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2019-90
With the complexity for VLSIs, transition fault testing is required. However, VLSIs generally have more untestable trans... [more] DC2019-90
pp.25-30
DC 2020-02-26
14:10
Tokyo   A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] DC2019-92
pp.37-42
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2019-03-18
09:00
Kagoshima Nishinoomote City Hall (Tanega-shima) A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem
Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) CPSY2018-117 DC2018-99
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] CPSY2018-117 DC2018-99
pp.315-320
DC 2019-02-27
09:50
Tokyo Kikai-Shinko-Kaikan Bldg. A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] DC2018-73
pp.13-18
DC 2019-02-27
13:40
Tokyo Kikai-Shinko-Kaikan Bldg. State Assignment Method to Improve Transition Fault Coverage for Datapath
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.) DC2018-78
Recently, it is indispensable to test in transition fault model due to timing defects increase along with complication a... [more] DC2018-78
pp.43-48
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