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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 13:25 |
Fukuoka |
Kitakyushu Science and Research Park |
Dynamically Variable Secure Scan Architecture against Scan-based Side Channel Attack on Cryptography LSIs Hiroshi Atobe, Ryuta Nara, Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki (Waseda Univ.) VLD2008-69 DC2008-37 |
Scan test is a powerful and popular test technique because it can control and observe the internal states of the circuit... [more] |
VLD2008-69 DC2008-37 pp.55-59 |
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