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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2012-12-14 11:15 |
Tokyo |
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Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2012-71 |
[more] |
R2012-71 pp.19-26 |
R |
2011-12-16 13:00 |
Tokyo |
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Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Fumiaki Harada (FXAT), Hiroyuki Gotoh (FUJITSU), Hiroki Takamura (JST), Yoshiki Kinoshita, Makoto Takeyama (AIST) R2011-37 |
[more] |
R2011-37 pp.1-7 |
DC, CPSY (Joint) |
2011-07-28 17:00 |
Kagoshima |
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Deviation Detection for Supporting Open System Dependability Midori Sugaya (Yokohama National Univ.), Hiroki Takamura (JST), Kimio Kuramitsu (Yokohama National Univ.) DC2011-18 |
Recently, in order to meet the various needs of users, systems have become much more sophisticated and complex.
In the... [more] |
DC2011-18 pp.19-24 |
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