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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 16:10 |
Ehime |
Ehime Prefecture Gender Equality Center |
Analysis of databases used for hot spot test cases Hiroki Ogura, Hidekazu Takahashi, Sinpei Sato, Atsushi Takahashi (Tokyo Tech) VLD2019-52 DC2019-76 |
With the miniaturization of semiconductor circuit patterns, the importance of photolithography has increased. In the sta... [more] |
VLD2019-52 DC2019-76 pp.191-196 |
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