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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
15:05
Miyazaki NewWelCity Miyazaki Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing
Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) CPM2011-160 ICD2011-92
Designing reliable systrems has become more difficult in recent years. Negative-Bias-Temperature-In-stability (NBTI) is ... [more] CPM2011-160 ICD2011-92
pp.59-63
ICD 2010-12-16
15:10
Tokyo RCAST, Univ. of Tokyo [Poster Presentation] A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor
Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2010-104
We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell in... [more] ICD2010-104
pp.55-58
VLD 2010-03-10
15:25
Okinawa   Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors
Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103
Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more]
VLD2009-103
pp.25-30
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