|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 15:05 |
Miyazaki |
NewWelCity Miyazaki |
Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) CPM2011-160 ICD2011-92 |
Designing reliable systrems has become more difficult in recent years. Negative-Bias-Temperature-In-stability (NBTI) is ... [more] |
CPM2011-160 ICD2011-92 pp.59-63 |
ICD |
2010-12-16 15:10 |
Tokyo |
RCAST, Univ. of Tokyo |
[Poster Presentation]
A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2010-104 |
We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell in... [more] |
ICD2010-104 pp.55-58 |
VLD |
2010-03-10 15:25 |
Okinawa |
|
Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103 |
Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more] |
VLD2009-103 pp.25-30 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|