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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SANE 2018-05-14
11:50
Tokyo Kikai-Shinko-Kaikan Bldg. SAVERS: SAR ATR with Verification Support Based on Convolutional Neural Network
Hidetoshi Furukawa
We propose a new convolutional neural network (CNN) which performs coarse and fine segmentation for end-to-end synthetic... [more] SANE2018-5
pp.23-28
SANE 2018-01-25
14:50
Nagasaki Nagasaki Prefectural Art Museum Deep Learning for End-to-End Automatic Target Recognition from Synthetic Aperture Radar Imagery
Hidetoshi Furukawa (Toshiba Infrastructure Systems & Solutions)
The standard architecture of synthetic aperture radar (SAR) automatic target recognition (ATR) consists of three stages:... [more] SANE2017-92
pp.35-40
SANE 2017-08-24
13:50
Osaka OIT UMEDA Campus Deep Learning for Target Classification from SAR Imagery -- Data Augmentation and Translation Invariance --
Hidetoshi Furukawa (Toshiba Infrastructure Systems & Solutions)
This report deals with translation invariance of convolutional neural networks (CNNs) for automatic target recognition (... [more] SANE2017-30
pp.13-17
SANE 2017-05-22
13:15
Tokyo Kikai-Shinko-Kaikan Bldg. Bias Estimation for Decentralized Sensor Fusion -- Multi-Agent Based Bias Estimation Method --
Hidetoshi Furukawa (Toshiba)
In multi-sensor data fusion (or sensor fusion), sensor biases (or offsets) often affect the accuracy of the correlation ... [more] SANE2017-7
pp.35-40
SANE 2016-10-20
15:20
Osaka OIT UMEKITA Knowledge Center Bias Estimation for Distributed Sensor Data Fusion -- Bias Estimation Method Based on Multi-Agent Model --
Hidetoshi Furukawa (Toshiba)
In multi-sensor data fusion, sensor biases (or offsets) often affect the accuracy of the correlation and integration res... [more] SANE2016-41
pp.13-16
SANE 2015-10-30
14:30
Osaka OIT UMEKITA Knowledge Center Sequential Test Using the Amplitude Information of Detected Signals for Track Confirmation
Hidetoshi Furukawa (Toshiba)
In the sequential test for track confirmation based on the observed values of the time series from the sensor, a tentati... [more] SANE2015-45
pp.19-24
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