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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2021-11-12
Online Online [Invited Talk] A theoretical study on Strain-induced Change of Schottky Energy Barrier of Dumbbell-shaped Graphene-nanoribbons for Highly Sensitive Strain Sensors
Qinqiang Zhang, Ken Suzuki, Hideo Miura (Tohoku Univ.)
SDM 2019-02-07
Tokyo   [Invited Talk] Grain-Boundary-Crystallinity Dependence of Mechanical Properties and EM Resistance of Electroplated Copper Interconnections
Yifan Luo, Yutaro Nakoshi, Ryota Mizuno, Ken Suzuki, Hideo Miura (Tohoku Univ.) SDM2018-94
 [more] SDM2018-94
SDM 2018-11-08
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Development of the evaluation method of the strength of polycrystalline materials based on the order of atom arrangement and its application to the strength evaluation of electroplated copper thin films
Ken Suzuki, Yifan Luo, Hideo Miura (Tohoku Univ.) SDM2018-68
 [more] SDM2018-68
SDM 2015-03-02
Tokyo Kikai-Shinko-Kaikan Bldg [Invited Talk] Effect of microtexture in electroplated copper thin-film interconnections on their migration resistance
Ken Suzuki, Takery Kato, Hideo Miura (Tohoku Univ) SDM2014-168
Both electrical and mechanical properties of electroplated copper thin-films vary drastically depending on their unique ... [more] SDM2014-168
SDM 2012-11-16
Tokyo Kikai-Shinko-Kaikan Bldg Effect of a three-dimensional strain field on the electronic band structures of carbon nanotubes and graphene sheets
Ken Suzuki, Masato Ohnishi, Hideo Miura (Tohoku Univ.) SDM2012-110
The prediction of the change in the conductivity of carbon nanotubes (CNTs) under strain is crucially important to assur... [more] SDM2012-110
SDM 2009-11-13
Tokyo Kikai-Shinko-Kaikan Bldg. Atomic Scale Analysis of the Degradation Mechanism of the Integrity High-k/Metal-gate Interface Caused by the Interaction between Point-Defects and Residual Strain around the Interface
Ken Suzuki, Yuta Itoh, Tatsuya Inoue, Hideo Miura (Tohoku Univ.), Hideki Yoshikawa, Keisuke Kobayashi (National Inst. for Materials Science), Seiji Samukawa (Tohoku Univ.) SDM2009-149
Control of the interfacial crystallographic structure between a dielectric film and a gate electrode is one of the most ... [more] SDM2009-149
ICD, CPM 2007-01-18
Tokyo Kika-Shinko-Kaikan Bldg. Local deformation and residual stress of thin chips stacked by flip chip structures
Hideo Miura, Nobuki Ueta, Yuki Sato (Tohoku Univ.)
 [more] CPM2006-140 ICD2006-182
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