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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SS 2015-03-09
16:35		 Okinawa OKINAWAKEN SEINENKAIKAN An Approach for Abbreviated Identifier Expansion with Machine Learning
Hideki Okajima, Osamu Mizuno (Kyoto Inst. Tech.) SS2014-68		 The readability of source code is a crucial factor on software development and maintenance. Identifier is a essential cl... [more] SS2014-68
pp.79-84
PRMU, SP, WIT 2010-10-08
16:20		 Chiba   Voice Guidance System for the Visually Impaired Using LED Illumination
Ryo Hamamura, Taki Yamamoto, Hideki Okamura (International Christian Univ.) 		 [more]
SDM, VLD 2007-10-31
13:50		 Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Inverter and SRAM circuits characteristics fluctuation
Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Labs.) VLD2007-65 SDM2007-209		  [more] VLD2007-65 SDM2007-209
pp.25-29
SP
Toyama Toyama Prefectural University Evaluation of speaker verification with NAM segments using unknown speakers
Hideki Okamoto, Mariko Kojima (NAIST), Tomoko Matsui (ISM), Hiromichi Kawanami, Hiroshi Saruwatari, Kiyohiro Shikano (NAIST) SP2007-37		 We investigated a speaker verification method that uses non-audible murmur (NAM) segments using newly collected data and... [more] SP2007-37
pp.79-84
SDM, VLD 2006-09-25
14:20		 Tokyo Kikai-Shinko-Kaikan Bldg. To be announced
Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Laboratories) 		 [more] VLD2006-36 SDM2006-157
pp.13-18
SDM, VLD 2006-09-26
10:25		 Tokyo Kikai-Shinko-Kaikan Bldg. To be announced
Yoshio Ashizawa, Hideki Oka (FUJITSU LABORATORIES) 		The density gradient approach is presented to device characteristics analysis with random dopant fluctuations. We invest... [more] VLD2006-40 SDM2006-161
pp.7-12
EE 2005-05-13
11:00		 Tokyo Kikai-Shinko-Kaikan Bldg. On Forward-Type Soft Switching AC/DC One-Converter With Clamp Circuit
Michihiko Nagao, Hideki Okamura, Koosuke Harada (Sojo Univ.) 		High power factor and soft switching can be easily obtained by connecting the LC resonant circuit in the input stage of ... [more] EE2005-3
pp.13-17
ICD 2005-04-15
14:30		 Fukuoka   New Development of Neutron-induced Soft-Error Simulation Technology
Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.) 		In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] ICD2005-19
pp.37-42
KBSE 2005-03-14
10:50		 Tokyo Kikai-Shinko-Kaikan Bldg. A Software Configuration Management Method based on Meta Object Facility Repositories
Yusuke Yamashita, Tomoyuki Azuma, Hideki Oka, Shingo Kamiya (NTT DATA) 		 [more] KBSE2004-47
pp.13-18
 Results 1 - 9 of 9  /   
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