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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 76  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ISEC 2021-05-19
11:05
Online Online [Invited Talk] Six-Card Finite-Runtime XOR Protocol with Only Random Cut (from APKC 2020)
Kodai Toyoda (Tohoku Univ.), Daiki Miyahara (Tohoku Univ./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2021-3
(To be available after the conference date) [more] ISEC2021-3
p.17
WBS, IT, ISEC 2021-03-04
14:55
Online Online A Physical Zero-knowledge Proof for Cryptarithmetic Using Dihedral Cards
Raimu Isuzugawa (Tohoku Univ.), Daiki Miyahara, Takaaki Mizuki (Tohoku Univ./AIST), Hideaki Sone (Tohoku Univ.) IT2020-135 ISEC2020-65 WBS2020-54
(To be available after the conference date) [more] IT2020-135 ISEC2020-65 WBS2020-54
pp.139-145
IA 2020-10-01
11:40
Online Online Ethical Education on Information Security Mind for Practical Security Learning
Yoshinari Kanaya (Tohoku Univ.), Daisuke Kotani (Kyoto Univ.), Katsuyoshi Iida (Hokkaido Univ.), Hideaki Sone (Tohoku Univ.) IA2020-2
Practical education on information security may cause trouble if any student in the course tries the new education again... [more] IA2020-2
pp.6-9
EMCJ, IEE-SPC
(Joint)
2019-11-15
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurement of an Effect of Resolution of Side Channel Waveform on Acquisition of Secret Key
Kohei Utsumi (Tohoku Univ), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ) EMCJ2019-73
A side-channel attack is known as a serious threat which can obtain a secret key by analyzing physical information leaka... [more] EMCJ2019-73
pp.13-16
ISEC 2019-05-17
17:00
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Five-Card AND Protocol in Committed Format Using Only Practical Shuffles (from APKC 2018)
Yuta Abe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2019-11
In this invited talk, we introduce the paper ``Five-Card AND Protocol in Committed Format Using Only Practical Shuffles'... [more] ISEC2019-11
p.49
COMP 2018-12-12
15:35
Miyagi Tohoku University A Millionaire Protocol Using a Standard Deck of Cards
Daiki Miyahara (Tohoku Univ./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) COMP2018-38
(To be available after the conference date) [more] COMP2018-38
pp.39-45
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] A Specification Method of Faulty Bytes in Cryptographic Module Using EM Information Leakage
Naoto Saga (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-68
Fault analysis methods such as Differential Fault Analysis (DFA) need ciphertexts which have specific timing faults and ... [more] EMCJ2018-68
pp.39-40
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module
Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-79
In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the... [more] EMCJ2018-79
pp.61-62
EMD 2018-11-09
15:55
Tokyo The University of Electro-Communications Study on the Effect of Surface Condition on High-Frequency Transmission Characteristics
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2018-46
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. In p... [more] EMD2018-46
pp.33-36
EMCJ 2018-07-27
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. A study on measuring method of influence of contact force of contact points on signal transmission characteristics
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-32
When a contact point of a connector connecting electric devices has poor maintenance or degradation over time, it causes... [more] EMCJ2018-32
pp.61-66
HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] 2018-07-25
16:15
Hokkaido Sapporo Convention Center Secure Multiparty Computation of Ranking Using a Deck of Cards
Ken Takashima, Yuta Abe, Tatsuya Sasaki, Daiki Miyahara (Tohoku Univ.), Kazumasa Shinagawa (Tokyo Inst. of Tech./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-30 SITE2018-22 HWS2018-27 ICSS2018-33 EMM2018-29
(To be available after the conference date) [more] ISEC2018-30 SITE2018-22 HWS2018-27 ICSS2018-33 EMM2018-29
pp.163-169
ISEC 2018-05-16
10:50
Tokyo Ookayama Campus, Tokyo Institute of Technology Improvements on Physical Zero-knowledge Proof for Kakuro
Daiki Miyahara, Tatsuya Sasaki, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-3
(To be available after the conference date) [more] ISEC2018-3
pp.17-23
ISEC 2018-05-16
11:30
Tokyo Ookayama Campus, Tokyo Institute of Technology [Invited Talk] The Minimum Number of Cards in Practical Card-Based Protocols (from ASIACRYPT 2017)
Daiki Miyahara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-4
In this invited talk, we introduce the paper ``The Minimum Number of Cards in Practical Card-Based Protocols'' by J. Kas... [more] ISEC2018-4
p.25
EMCJ 2017-11-22
14:15
Tokyo Kikai-Shinko-Kaikan Bldg. Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI
Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into ... [more] EMCJ2017-71
pp.41-44
EMCJ 2017-11-22
15:40
Tokyo Kikai-Shinko-Kaikan Bldg. A Study on Evaluation Method for EM Information Leakage Utilizing Controlled Image Displaying
Gentaro Tanabe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-74
Evaluation of electromagnetic information leakage from display devices are generally conducted by actual attacks retriev... [more] EMCJ2017-74
pp.57-62
EMCJ 2017-11-22
16:05
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Evaluation Method for Information Leakage of Cryptographic Devices Based on Frequency Selection
Airi Sugimoto (Tohoku Univ.), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-75
Evaluating electromagnetic information leakage from a cryptographic device takes a considerable amount of time because o... [more] EMCJ2017-75
pp.63-66
EMD 2017-11-17
13:20
Tokyo The University of Electro-Communications The influence of contact conditions of gap on the frequency characteristics of the transmission line
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2017-47
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. Prev... [more] EMD2017-47
pp.27-30
IA 2017-11-15
16:30
Overseas KMITL, Bangkok, Thailand [Poster Presentation] Basic SecCap, Practical Education for Information Security by University Cooperation
Hideaki Sone, Satoru Izumi (Tohoku Univ.) IA2017-36
Introduction and activity report on “Basic SecCap.”
The Graduate School of Information Science of Tohoku University is... [more]
IA2017-36
pp.33-34
ISEC 2017-09-04
12:10
Tokyo Kikai-Shinko-Kaikan Bldg. A Lower Bound on the Number of Shuffles for Commited-Format AND Protocols
Daiki Miyahara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2017-43
(To be available after the conference date) [more] ISEC2017-43
pp.15-22
EMCJ, IEE-EMC, IEE-MAG 2017-05-18
14:40
Overseas Nanyang Technological University [Poster Presentation] Fundamental Study on the Effect of Contact Condition at Gap of Transmission Line on Transmission Characteristic
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-8
When a connector of an information transmission cable has loose contact or degradation over time, the effect may lead to... [more] EMCJ2017-8
pp.3-4
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