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Committee Date Time Place Paper Title / Authors Abstract Paper #
DE, DC 2007-10-16
11:30
Tokyo Kikai-Shinko-Kaikan Bldg Evaluation Model of Pseudo Random Pattern Quality for Logic BIST
Satoshi Fukumoto, Harunobu Kurokawa, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DE2007-124 DC2007-21
In this paper, we discuss the stochastic and statistical analyses on the distribution of fault coverage in random-patter... [more] DE2007-124 DC2007-21
pp.51-56
ICD, CPM 2005-01-28
15:00
Tokyo Kikai-Shinko-Kaikan Bldg. Selection of Seeds and Phase Shifters for Scan BIST
Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.)
In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, com... [more] CPM2004-171 ICD2004-216
pp.53-58
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