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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2019-02-27
Tokyo Kikai-Shinko-Kaikan Bldg. FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] DC2018-79
DC 2015-02-13
Tokyo Kikai-Shinko-Kaikan Bldg A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis
Senling Wang, Taiga Inoue, Hanan, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2014-87
 [more] DC2014-87
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