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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2019-02-27 14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] |
DC2018-79 pp.49-54 |
DC |
2015-02-13 16:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2014-87 |
[more] |
DC2014-87 pp.55-60 |
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