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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2006-06-22
10:30
Hiroshima Faculty Club, Hiroshima Univ. Analysis of nitrogen depth profile in SiO2/SiN stacks studied by angle-resolved photoemission spectroscopy
Satoshi Toyoda, Jun Okabayashi, Masaharu Oshima (Tokyo Univ.), Guo-Lin Liu, Ziyuan Liu, Kazuto Ikeda, Koji Usuda (STARC)
Nitrogen in-depth profile and chemical states in Si oxynitride films are important to understand characteristics of the ... [more] SDM2006-55
pp.77-80
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