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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2011-06-24 16:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Low Power At-Speed Scan Testing for LOS Scheme by Test Vector Modification Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto (KIT), Yuta Yamato (NAIST), Xiaoqing Wen, Seiji Kajihara (KIT), Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Verazel (Lirmm) DC2011-13 |
In this paper, we present a test vector modification method to reduce launch-to-capture power for LOS scheme. The propos... [more] |
DC2011-13 pp.29-34 |
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