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Conference Papers (Available on Advance Programs) (Sort by: Date Descending)

Committee	Date Time	Place		Paper Title / Authors	Abstract	Paper #
DC	2012-02-13 14:50	Tokyo	Kikai-Shinko-Kaikan Bldg.	A Test Generation Method for Synchronously Designed QDI Circuits Koki Uchida, Eri Murata (NAIST), Satoshi Ohtake (Oita Univ.), Yasuhiko Nakashima (NAIST) DC2011-83	Quasi-Delay-Insensitive(QDI) design has been attracting attention as one of the practical techniques for implementation ... [more]	DC2011-83 pp.43-48
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail]	2011-11-30 11:20	Miyazaki	NewWelCity Miyazaki	A Method of Thermal Uniformity Control During BIST Eri Murata (NAIST), Satoshi Ohtake (Oita Univ.), Yasuhiko Nakashima (NAIST) VLD2011-86 DC2011-62	Along with the improvement in semiconductor technology, it is important to ensure product quality that small delay defec... [more]	VLD2011-86 DC2011-62 pp.197-202

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