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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
US 2021-01-29
14:55
Online Online Curvature measurement of flexible array probe using sheet type sensor for bending
Yuusuke Tanaka, Daisuke Hirano, Yoshiaki Iwata, Yukio Ogura (Japan Probe) US2020-60
 [more] US2020-60
pp.15-20
US 2016-06-10
15:45
Toyama Gofuku Campus, University of Toyama Development of Flexible Ultrasonic Array Probe with High Flexibility and Its Application
Yuusuke Tanaka, Hidekazu Hoshino, Daisuke Hirano, Akira Sakai, Yoshiaki Iwata, Yukio Ogura (Japan Probe) US2016-27
We have developed a flexible array probe with high flexibility. The flexible array probe was improved, it had a higher f... [more] US2016-27
pp.43-46
IBISML 2015-11-26
15:00
Ibaraki Epochal Tsukuba [Poster Presentation] Selective sampling by using Gaussian Process and its application to material science
Daisuke Hirano (NIT), Kazuaki Toyoura (Nagoya Univ.), Atsuto Seko (Kyoto Univ.), Motoki Shiga (Gifu Univ.), Akihide Kuwabara (JFCC), Masayuki Karasuyama (NIT), Kazuki Shitara (Kyoto Univ.), Ichiro Takeuchi (NIT) IBISML2015-66
Various physical phenomena and properties of an unknown material are often revealed by exhaustively evaluating the entir... [more] IBISML2015-66
pp.99-106
US 2015-06-19
13:20
Kumamoto Kumamoto University Development of Flexible Ultrasonic Probe and Application for Medical Ultrasound
Yuusuke Tanaka, Hidekazu Hoshino, Mitsuyoshi Yoshida, Bun Ri, Akira Sakai, Daisuke Hirano, Yukio Ogura (Japan Probe) US2015-18
We developed a soft ultrasonic probe that was deformable for shape of the object. It was described about the observation... [more] US2015-18
pp.13-16
VLD, IPSJ-SLDM 2015-05-14
15:25
Fukuoka Kitakyushu International Conference Center AES Encryption Circuit against Clock Glitch based Fault Analysis
Daisuke Hirano, Youhua Shi, Nozomu Togawa, Masao Yanagisawa (Waseda Univ) VLD2015-7
Recently, fault analysis has attracted a lot of attentions as a new kind of side channel attack methods,in which malicio... [more] VLD2015-7
pp.51-55
US 2015-02-27
15:30
Kanagawa IHI Yokohama Development of flexible ultrasonic probe detecting flaw in arbitrary-shaped specimen
Yuusuke Tanaka, Daisuke Hirano, Yoshiaki Iwata, Akira Sakai, Hidekazu Hoshino, Yukio Ogura (Japan Probe) US2014-101
 [more] US2014-101
pp.41-44
 Results 1 - 6 of 6  /   
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