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 Results 1 - 20 of 63  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2022-07-19
Online Online Randomness evaluation of TERO-based TRNG with a side-channel attack countermeasure
Saki Osuka (AIST), Daisuke Fujimoto, Yuichi Hayashi (NAIST), Shinichi Kawamura (AIST)
(To be available after the conference date) [more]
EMCJ 2022-06-10
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Fundamental Study of Electromagnetic Information Leakage Suppression at Printed Circuit Board Power Delivery Network in Cryptographic Devices
Shinpei Wada, Daisuke Fujimoto, Yuichi Hayashi, Youngwoo Kim (NAIST) EMCJ2022-27
 [more] EMCJ2022-27
HWS 2022-04-26
Tokyo AIST Tokyo Waterfront (Annex)
(Primary: On-site, Secondary: Online)
Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values
Shugo Kaji, Ayaki Tachikake, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2022-4
An individual identification using a capacitance sensor configured with a constant current source and an A/D converter i... [more] HWS2022-4
HWS 2022-04-26
Tokyo AIST Tokyo Waterfront (Annex)
(Primary: On-site, Secondary: Online)
Evaluation of Electromagnetic Information Leakage Intensity from Displays under Different Usage Environment
Yoshiki Kitamura, Taiki Kitazawa, Daisuke Fujimoto, Yuichi Hayahi (NAIST) HWS2022-5
The threat of TEMPEST attack which reconstructs the screen information from the electromagnetic leakage caused by operat... [more] HWS2022-5
EMCJ 2022-04-15
(Primary: On-site, Secondary: Online)
Analysis of Crosstalk Suppression by Low-Impedance PDN Using Ultra-Thin and High Dielectric Permittivity Substrates
Taiki Kitazawa, Youngwoo Kim, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-5
The high impedance power delivery network (PDN) induced crosstalk is caused by the return current discontinuity of signa... [more] EMCJ2022-5
VLD, HWS [detail] 2022-03-08
Online Online Evaluation Method for EM Information Leakage from Speakerphone Using Voice Frequency Spectrum Analysis
Hiroyuki Ueda, Seiya Takano, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-102 HWS2021-79
The usage environment for speakerphones becomes more diverse with remote work. As a result, the surrounding environment ... [more] VLD2021-102 HWS2021-79
VLD, HWS [detail] 2022-03-08
Online Online Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables -- Impact of Modulation Factor and Emission Intensity --
Taiga Yukawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-103 HWS2021-80
The threats of electromagnetic (EM) information leakage caused by hardware Trojans (HTs) implemented on signal cables ha... [more] VLD2021-103 HWS2021-80
VLD, HWS [detail] 2022-03-08
Online Online Development of a Test Environment for Attack-Resistance Evaluation of Matrix Direct ToF Lidar
Masato Suzuki, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-105 HWS2021-82
Matrix-type Direct Time of flight (dToF) Lidar, which enables high-resolution and high-speed acquisition of distance inf... [more] VLD2021-105 HWS2021-82
HWS, ICD [detail] 2021-10-19
Online Online Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase
Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] HWS2021-43 ICD2021-17
HWS, ICD [detail] 2021-10-19
Online Online Fundamental Study on Hardware Trojan Detection on Cable Using On-chip Sensor
Yo Nishitoba, Shugo Kaji (NAIST), Masahiro Kinugawa (Fukuchiyama Univ.), Daisuke Fujimoto, Yuichi Hayshi (NAIST) HWS2021-48 ICD2021-22
There have been reports of threats that cause information leakage by inserting Hardware Trojans (HT) into the connection... [more] HWS2021-48 ICD2021-22
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2021-07-19
Online Online Fundamental Study on Acceleration of Inversion using Binary Extended Euclidean Algorithm for Pairing Computation in RNS Representation
Kota Morimoto, Daisuke Fujimoto, Saki Osuka (NAIST), Shinichi Kawamura, Tadanori Teruya (AIST), Yuichi hayashi (NAIST) ISEC2021-10 SITE2021-4 BioX2021-11 HWS2021-10 ICSS2021-15 EMM2021-15
Pairing computation is an essential tool in advanced cryptography, and Yao et al. have shown that a hardware implementat... [more] ISEC2021-10 SITE2021-4 BioX2021-11 HWS2021-10 ICSS2021-15 EMM2021-15
HWS 2021-04-12
Tokyo Tokyo University/Online
(Primary: On-site, Secondary: Online)
Fundamental Study on Evaluating Frequency Injection Attack Resistance against RO-based TRNGs
Riki Hashimoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2021-9
Frequency injection attacks have been reported as an attack to degrade the randomness of ring oscillator (RO)-based true... [more] HWS2021-9
EMD 2021-03-08
Online Online Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors
Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] EMD2020-37
HWS, VLD [detail] 2021-03-04
Online Online Screen Information Reconstruction from High Resolution Displays Focusing on Multiple Leakage Frequencies
Kimihiro Arai, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2020-90 HWS2020-65
 [more] VLD2020-90 HWS2020-65
HWS, VLD [detail] 2021-03-04
Online Online Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures
Shogo Fukushima, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2020-91 HWS2020-66
Conventional studies on EM information leakage have mainly focused on only individual information devices. On the other ... [more] VLD2020-91 HWS2020-66
EMD 2020-12-04
Online Online Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation
Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] EMD2020-24
ICD, HWS [detail] 2020-10-26
Online Online Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference -- Impact of Impedance Change in Digital Output Circuits --
Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] HWS2020-27 ICD2020-16
EMCJ 2020-07-02
Online Online Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] EMCJ2020-15
HWS, VLD [detail] 2020-03-06
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Fundamental Study on Fault Analysis with Non-Uniform Faulty Values Caused at Fault Injection into Sequential Circuit
Takumi Okamoto, Daisuke Fujimoto (NAIST), Kazuo Sakiyama, Li Yang (UEC), Yu-ichi Hayashi (NAIST) VLD2019-128 HWS2019-101
Fault analysis for the cryptographic module is roughly divided into two phases; those are injecting transient faults and... [more] VLD2019-128 HWS2019-101
Tokyo Asakusabashi Hulic Conference [Poster Presentation] Evaluation of Information Leakage Induced by IEMI from ICs with Multiple Data Communication Lines
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST)
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