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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, R 2014-02-21
Osaka   Three-dimensional comparisons of damage shapes on Ag and AgSnO2 contact surfaces caused by break arc discharges
Makoto Hasegawa, Daichi Kawamura (Chitose Inst. of Science and Tech.) R2013-86 EMD2013-142
Observation and evaluation of changes (damage growth) on contact surfaces caused by arc discharges are important for rea... [more] R2013-86 EMD2013-142
EMD 2013-11-17
Overseas Huazhong University of Science and Technology, Wuhan, P.R.China Three-dimensional observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces
Daichi Kawamura, Makoto Hasegawa (Chitose Inst. of Science & Tech.) EMD2013-104
A growth process of damage shapes (specifically growth of a crater) on a cathode surface of a Ag contact pair and a AgSn... [more] EMD2013-104
EMD 2013-05-17
Hokkaido Chitose Arcadia Plaza Observation of damage shapes caused by break arcs on Ag and AgSnO2 contact surfaces during switching operations
Makoto Hasegawa, Keisuke Takahashi, Daichi Kawamura, Yuya Hirano (Chitose Inst. of Science and Tech.) EMD2013-6
An evaluation system enabling observation and evaluation of changes on contact surface conditions (growth of a crater an... [more] EMD2013-6
EMD 2013-03-01
Saitama Nippon Institute of Technology Damage shape evaluation system of electrical contacts and investigation of material transfer and erosion phenomena
Keisuke Takahashi, Daichi Kawamura, Yuya Hirano, Makoto Hasegawa (Chitose Inst. of Science and Tech.) EMD2012-118
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] EMD2012-118
EMD 2013-01-25
Kanagawa Hitachi, Ltd., (Totsuka, Yokohama) An experimental study on a 3-D shape observation system of a sample by employing a laser displacement sensor
Makoto Hasegawa, Daichi Kawamura, Keisuke Takahashi (Chitose Inst. of Science and Tech.) EMD2012-100
For the purpose of observing and evaluating damaged shapes due to material transfer and erosion, caused by arc discharge... [more] EMD2012-100
OCS, LQE, OPE 2011-10-27
Kochi Kochi University of Technology 25Gbit/s Optical Tranceiver Using Lens Integrated Optical Deices and CMOS Integrated Circuit for Optical Interconnects
Daichi Kawamura, Toshiaki Takai, Yong Lee, Yasunobu Matsuoka, Koichiro Adachi, Norio Chujo, Kenji Kogo, Saori Hamamura, Takashi Takemoto, Hiroki Yamashita, Toshiki Sugawara, Shinji Tsuji (Hitachi) OCS2011-69 OPE2011-107 LQE2011-70
We developed the high-speed optical transceiver for board-to-board and rack-to-rack optical interconnects. Lens integrat... [more] OCS2011-69 OPE2011-107 LQE2011-70
PN 2011-08-01
Hokkaido Hakodate-shi Kinrousha Sougou Fukushi Center [Invited Talk] High Speed Optical Interconnect Technologies for Next Generation IT Systems
Toshiki Sugawara (Hitachi), Yong Lee (Hitachi/PETRA), Daichi Kawamura (Hitachi), Koichiro Adachi, Kazunori Shinoda (Hitachi/PETRA), Yasunobu Matsuoka (Hitachi), Shinji Tsuji (Hitachi/PETRA) PN2011-15
The increasing of the recent internet traffic requires the high-speed transmission inter- and intra equipment of IT syst... [more] PN2011-15
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