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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ED
(Workshop)
2012-06-27
14:15
Okinawa Okinawa Seinen-kaikan Stress Measurement Errors induced by the Strain Effects in Resistor-based Stress Sensors on (111) silicon
Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.)
 [more]
SDM, ED
(Workshop)
2012-06-29
10:45
Okinawa Okinawa Seinen-kaikan ICPCVD SiO2 for AlGaN/GaN MISHFET application
Bong-Ryeol Park, Jae-Gil Lee, Hyungtak Kim, Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.)
 [more]
ED, SDM 2010-07-02
10:15
Tokyo Tokyo Inst. of Tech. Ookayama Campus Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients
Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) ED2010-86 SDM2010-87
 [more] ED2010-86 SDM2010-87
pp.155-160
ED, SDM 2010-07-02
09:55
Tokyo Tokyo Inst. of Tech. Ookayama Campus Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors
Jaegil Lee, Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) ED2010-104 SDM2010-105
 [more] ED2010-104 SDM2010-105
pp.237-240
SDM, ED 2009-06-25
10:45
Overseas Haeundae Grand Hotel, Busan, Korea 4H-SiC Avalanche Photodiodes for 280 nm UV Detection.
B. R. Park, H. Sung, Chun-Hyung Cho (Hongik Univ.), P. M. Sandvik (GE), Ho-Young Cha (Hongik Univ.) ED2009-73 SDM2009-68
 [more] ED2009-73 SDM2009-68
pp.105-108
 Results 1 - 5 of 5  /   
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