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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ED (Workshop) |
2012-06-27 14:15 |
Okinawa |
Okinawa Seinen-kaikan |
Stress Measurement Errors induced by the Strain Effects in Resistor-based Stress Sensors on (111) silicon Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) |
[more] |
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SDM, ED (Workshop) |
2012-06-29 10:45 |
Okinawa |
Okinawa Seinen-kaikan |
ICPCVD SiO2 for AlGaN/GaN MISHFET application Bong-Ryeol Park, Jae-Gil Lee, Hyungtak Kim, Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) |
[more] |
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ED, SDM |
2010-07-02 10:15 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) ED2010-86 SDM2010-87 |
[more] |
ED2010-86 SDM2010-87 pp.155-160 |
ED, SDM |
2010-07-02 09:55 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors Jaegil Lee, Chun-Hyung Cho, Ho-Young Cha (Hongik Univ.) ED2010-104 SDM2010-105 |
[more] |
ED2010-104 SDM2010-105 pp.237-240 |
SDM, ED |
2009-06-25 10:45 |
Overseas |
Haeundae Grand Hotel, Busan, Korea |
4H-SiC Avalanche Photodiodes for 280 nm UV Detection. B. R. Park, H. Sung, Chun-Hyung Cho (Hongik Univ.), P. M. Sandvik (GE), Ho-Young Cha (Hongik Univ.) ED2009-73 SDM2009-68 |
[more] |
ED2009-73 SDM2009-68 pp.105-108 |
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