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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2011-12-16 09:55 |
Osaka |
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A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129 |
MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] |
ICD2011-129 pp.131-136 |
ICD, SDM |
2010-08-27 14:10 |
Hokkaido |
Sapporo Center for Gender Equality |
A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop Capable of Protecting Soft Errors on the C-element Jun Furuta (Kyoto Univ.), Chikara Hamanaka, Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) SDM2010-146 ICD2010-61 |
[more] |
SDM2010-146 ICD2010-61 pp.121-124 |
VLD |
2010-03-10 15:25 |
Okinawa |
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Generation Mechanism of SEU and MCU Caused by Parasitic Lateral Bipolar Transitstors Chikara Hamanaka (Kyoto Institute of Tech.), Jun Furuta, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Institute of Tech.), Hidetoshi Onodera (Kyoto Univ./JST, CREST) VLD2009-103 |
Tolerance for soft-error decreases as integration advances. SEU(Single Event Upset), flipping one bit
and MCU(Multi-Cel... [more] |
VLD2009-103 pp.25-30 |
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