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Committee Date Time Place Paper Title / Authors Abstract Paper #
OME 2017-11-17
13:45
Osaka Osaka Univ. Nakanoshima Center Hole mobility measurement in organic semiconductor thin films by MIS-CELIV method
Chiho Katagiri (Yamagata Univ./Osaka Univ.), Ken-ichi Nakayama (Osaka Univ./Yamagata Univ.) OME2017-28
The MIS-CELIV method is expected as a novel technique for measuring electron and hole mobilities in thin organic films. ... [more] OME2017-28
pp.7-10
ED 2014-04-17
16:15
Yamagata The 100th Anniversary Hall, Yamagata University Vertical mobility measurement in organic semiconductor thin films by using Dark CELIV method
Chiho Katagiri, Ken-ichi Nakayama (Yamagata Univ.) ED2014-8
The CELIV method can estimate charge-carrier mobility by transient displacement current originating from extraction equi... [more] ED2014-8
pp.27-30
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