IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
... (for ESS/CS/ES/ISS)
Tech. Rep. Archives
... (for ES/CS)
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 6件中 1~6件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:30
Osaka Ritsumeikan University, Osaka Ibaraki Campus Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.)
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]
VLD2016-52 DC2016-46
pp.49-54
ICD, CPSY 2015-12-17
09:40
Kyoto Kyoto Institute of Technology RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayash (KIT), Hidetoshi Onodera (KU)
 [more] ICD2015-63 CPSY2015-76
pp.1-6
ICD, CPSY 2015-12-17
16:00
Kyoto Kyoto Institute of Technology [Poster Presentation] RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU)
 [more]
ICD, CPSY 2014-12-02
14:50
Tokyo Kikai-Shinko-Kaikan Bldg. Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.)
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] ICD2014-106 CPSY2014-118
pp.123-128
ICD, SDM 2014-08-05
14:55
Hokkaido Hokkaido Univ., Multimedia Education Bldg. Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage
Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT)
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature
Instability (BTI), become dominant on inte... [more]
SDM2014-79 ICD2014-48
pp.93-98
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-28
13:20
Kagoshima   Evaluations of Variations on Ring Oscillators from Plasma Induced Damage in Bulk and SOTB Processes
Ryo Kishida, Michitarou Yabuuchi, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. of Tech.)
A degradation of reliability caused by plasma induced damage has become a significant concern with miniaturizing a devic... [more] VLD2013-83 DC2013-49
pp.159-164
 6件中 1~6件目  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan