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Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, MW 2012-01-12
15:10
Tokyo Kikai-Shinko-Kaikan Bldg Ruggedness and Reliability of GaN HEMT for L/S-band High Power Applications
Ken Kikuchi, Fumikazu Yamaki, Kazutaka Inoue (SEI), Masahiro Nishi, Hitoshi Haematsu, Norihiko Ui, Kaname Ebihara, Atsushi Nitta (SEDI), Seigo Sano (SEI) ED2011-138 MW2011-161
We have evaluated our L/S-band GaN HEMT for ruggedness and reliability. In terms of ruggedness, we demonstrated our GaN ... [more] ED2011-138 MW2011-161
pp.107-110
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