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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED, MW |
2012-01-12 15:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Ruggedness and Reliability of GaN HEMT for L/S-band High Power Applications Ken Kikuchi, Fumikazu Yamaki, Kazutaka Inoue (SEI), Masahiro Nishi, Hitoshi Haematsu, Norihiko Ui, Kaname Ebihara, Atsushi Nitta (SEDI), Seigo Sano (SEI) ED2011-138 MW2011-161 |
We have evaluated our L/S-band GaN HEMT for ruggedness and reliability. In terms of ruggedness, we demonstrated our GaN ... [more] |
ED2011-138 MW2011-161 pp.107-110 |
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