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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2018-06-25
14:00		 Aichi Nagoya Univ. VBL3F [Invited Lecture] Progress in Diamond Field Effect Transistors
Hiroshi Kawarada, Nobutaka Oi, Bi Te, Shoichiro Imanishi, Masayuki Iwatakaki, Taichi Yabe, Atsushi Hiraiwa (Waseda Univ.) SDM2018-21		 2 dimensional hole gas at diamond and insulator interface is used for field effect transistor (FET). High voltage (~2000... [more] SDM2018-21
pp.23-28
DC 2017-02-21
10:30		 Tokyo Kikai-Shinko-Kaikan Bldg. A dynamic test compaction method on low power oriented test generation using capture safe test vectors
Toshinori Hosokawa, Atsushi Hirai, Hiroshi Yamazaki, Masayuki Arai (Nihon Univ.) DC2016-74		 In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the ... [more] DC2016-74
pp.1-6
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2014-11-28
09:40		 Oita B-ConPlaza A Test Generation Method for Low Capture Power Using Capture Safe Test Vectors
Atsushi Hirai, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2014-98 DC2014-52		 In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the ... [more] VLD2014-98 DC2014-52
pp.179-184
DC 2014-02-10
16:00		 Tokyo Kikai-Shinko-Kaikan Bldg. A Low Power Consumption Oriented Test Generation Method for Transition Faults Using Multi Cycle Capture Test Generation
Hiroshi Yamazaki, Yuto Kawatsure, Jun Nishimaki, Atsushi Hirai, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ), Koji Yamazaki (Meiji Univ) DC2013-89		 High power dissipation can occur when the response to a test pattern is captured by flip-flops in at-speed scan testing,... [more] DC2013-89
pp.61-66
AI 2009-01-16
13:30		 Tokyo   Image classification using textized Image
Atsushi Hirai, Nuo Zhang, Toshinori Watanabe, Hisashi Koga (Univ of Electro-Communications) AI2008-42		 With the development of the information technology, the number of electronic information increases rapidly. In which, fo... [more] AI2008-42
pp.7-12
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