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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2018-02-20 14:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84 |
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] |
DC2017-84 pp.43-48 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 11:45 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61 |
Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] |
VLD2016-67 DC2016-61 pp.135-140 |
VLD, IPSJ-SLDM |
2006-05-12 11:15 |
Ehime |
Ehime University |
Power-Conscious Microprocessor-Based Testing of System-on-Chip Fawnizu Azmadi Hussin, Tomokazu Yoneda (NAIST), Alex Orailoglu (Univ. of California), Hideo Fujiwara (NAIST) |
In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and resp... [more] |
VLD2006-10 pp.25-30 |
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