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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2018-02-20
14:25
Tokyo Kikai-Shinko-Kaikan Bldg. A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation
Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] DC2017-84
pp.43-48
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-30
11:45
Osaka Ritsumeikan University, Osaka Ibaraki Campus A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61
Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] VLD2016-67 DC2016-61
pp.135-140
VLD, IPSJ-SLDM 2006-05-12
11:15
Ehime Ehime University Power-Conscious Microprocessor-Based Testing of System-on-Chip
Fawnizu Azmadi Hussin, Tomokazu Yoneda (NAIST), Alex Orailoglu (Univ. of California), Hideo Fujiwara (NAIST)
In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and resp... [more] VLD2006-10
pp.25-30
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