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Committee Date Time Place Paper Title / Authors Abstract Paper #
SS 2018-03-07
15:00
Okinawa   Suggestion of Test Case Generation Method with Priority Based on Use Case of User for System Test
Emi Saito, Ai Toshikuni, Yuichiroh Nakagawa (Hitachi) SS2017-76
In embedded systems, developers have a demand to find serious defects early. We suppose that it is serious as defects to... [more] SS2017-76
pp.69-74
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