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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EID, ITE-IDY, SID-JC [detail] | 2015-07-30 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Lecture]
Switchable 2D/3D display for Adapting 3D Viewing Angle Ayako Takagi, Shinichi Uehara, Masako Kashiwagi, Yuko Kizu, Masahiro Baba (Toshiba R&D center) |
[more] | |
| AP, RCS (Joint) |
2011-11-18 09:40 |
Aichi | Nagoya Congress Center | The study of multiband autonomous impedance regulation antenna system with using a probe Makoto Higaki, Shuichi Obayashi, Hiroki Shoki (Toshiba R&D Center)  AP2011-114 |
[more] | AP2011-114 pp.141-144 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-30 11:05 |
Fukuoka | Kyushu University | [Invited Talk]
A wafer-level system integration technology for heterogeneous devices with pseudo-SoC Hiroshi Yamada, Yutaka Onozuka, Atsuko Iida, Kazuhiko Itaya, Hideyuki Funaki (Toshiba R&D Center) CPM2010-135 ICD2010-94 |
A wafer level system integration technology for heterogeneous devices has been developed by applying pseudo-SOC. The ... [more] |
CPM2010-135 ICD2010-94 pp.67-72 |
| AP | 2010-02-18 16:00 |
Tokyo | Toshiba | [Special Talk]
TBD
-- TBD -- Haruhiko Okumura (Toshiba) |
[more] | |
| ITE-IDY, EID, ITE-HI, ITE-3DMT, LSJ, IEE-OQD | 2009-10-08 16:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Image gamut expansion using the properties of brightness perception Yoshie Imai, Toshimitsu Kaneko, Masahiro Baba, Goh Itoh (Toshiba) EID2009-26 |
Recently, the color gamut of display is becoming wider and wider while that of input image is still narrow. When the in... [more] | EID2009-26 pp.33-36 |
| ICD, SDM | 2009-07-16 15:50 |
Tokyo | Tokyo Institute of Technology | The Study of Mobility-Tinv Trade-off in Deeply Scaled High-k/Metal Gate Devices and Scaling Design Guideline for 22nm-node Generation Masakazu Goto, Shigeru Kawanaka, Seiji Inumiya, Naoki Kusunoki, Masumi Saitoh, Kosuke Tatsumura, Atsuhiro Kinoshita, Satoshi Inaba, Yoshiaki Toyoshima (Toshiba) SDM2009-107 ICD2009-23 |
The trade-off between Tinv scaling and carrier mobility () degradation in deeply scaled HK/MG nMOSFETs has been ... [more] | SDM2009-107 ICD2009-23 pp.53-56 |
| ICD, SDM | 2008-07-17 15:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Co-design of CNT based devices and circuitry
-- How can CNT-based circuit overcome Si-CMOS? -- Shinobu Fujita (Toshiba RDC) SDM2008-138 ICD2008-48 |
Emerging devices using new materials (post-Si) are expected to replace Si-based MOSFET in future. This paper firstly cla... [more] | SDM2008-138 ICD2008-48 pp.59-64 |
| SDM | 2008-03-14 13:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | 15nm Planar Bulk SONOS-type Memory with Double Junstion Tunnel Layers Ryuji Ohba, Yuichiro Mitani, Naoharu Sugiyama, Shinobu Fujita (Toshiba) SDM2007-273 |
15nm gate length bulk-planar SONOS-type memory device, which has Si nanocrystal layer lying between double tunnel oxides... [more] | SDM2007-273 pp.1-6 |
| SDM | 2006-06-22 10:55 |
Hiroshima | Faculty Club, Hiroshima Univ. | Realization of SiON films with small ΔVfb Daisuke Matsushita, Koichi Muraoka, Yasushi Nakasaki, Koichi Kato, Shoko Kikuchi, Kiwamu Sakuma, Yuichiro Mitani (toshiba R&D center), Mariko Takayanagi, Kazuhiro Eguchi (Semiconductor Company) |
[more] | SDM2006-56 pp.81-86 |
| SR | 2005-07-28 16:00 |
Kanagawa | Yokosuka Research Park | (Panel discussion)Key technologies and challenges for mobile SDR realization Manabu Mukai (Toshiba R&D center) |
[more] | SR2005-24 pp.31-38 |
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