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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2022-06-21
15:10		 Aichi Nagoya Univ. VBL3F [Invited Lecture] Study on TMD mixed crystal characteristics and novel precursor for low-temperature CVD.
Atsushi Ogura, Ryo Yokogawa (Meiji Univ., MREL), Hitoshi Wakabayashi (Tokyo Tech.) SDM2022-28		  [more] SDM2022-28
pp.16-19
DC 2011-02-14
10:00		 Tokyo Kikai-Shinko-Kaikan Bldg. The development of the DDR3 memory module tester used on memory test processor
Takeshi Asakawa, Satoshi Matsuno (Tokai Univ.), Hidekazu Tsuchiya (Hitachi), Tatsuya Seki, Shinichi Kmazawa (Techinica) DC2010-59		 The testing for the memory module is necessary to warrant the quality in the memory module manufacturer. However, there ... [more] DC2010-59
pp.1-6
IN, ICM, LOIS
(Joint)		 2006-01-19
10:00		 Kyoto Kyoto Univ. DACS(Destination Addressing Control System) Scheme for Realizing New Network Service
Kazuya Odagiri, Naohiro Ishii (Aichi Institute of Technology), Rihito Yaegashi, Masaharu Tadauchi (Toyota Techinical Institute) 		This paper proposes a DACS(Destination Addressing Control System) scheme, which realizes a new network service by the co... [more] IN2005-129
pp.1-6
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