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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 13件中 1~13件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
RCS 2020-04-24
11:20
Oita Hotel Beppu Hosenso [Invited Lecture] T.B.D
Shinichi Kitazono (SSS)
 [more]
SDM 2020-02-07
16:25
Tokyo Tokyo University-Hongo [Invited Talk] Nanophotonics contributions to state-of-the-art CMOS Image Sensors
Sozo Yokogawa (SSS) SDM2019-97
Recent progress of Back-illuminated CMOS image sensor (BI-CIS), focusing on their pixel improvements with design of opti... [more] SDM2019-97
pp.39-43
CPSY, DC, IPSJ-ARC
(Joint) [detail]
2018-08-01
18:30
Kumamoto Kumamoto City International Center
Takeharu Ikezoe, Hideharu Amano (Keio Univ.), Junya Akaike, Kimiyoshi Usami, Masaru Kudo (SIT), Keizo Hiraga, Yusuke Shuto, Kojiro Yagami (Sony SS) CPSY2018-32
 [more] CPSY2018-32
pp.229-234
VLD, HWS
(Joint)
2018-03-02
10:30
Okinawa Okinawa Seinen Kaikan Implementation of Reconfigurable Accelerator Cool Mega-Array Using MTJ-based Nonvolatile Flip-Flop Enabling to Verify Stored Data
Junya Akaike, Kimiyoshi Usami, Masaru Kudo (SIT), Hideharu Amano, Takeharu Ikezoe (Keio Univ.), Keizo Hiraga, Yusuke Shuto, Kojiro Yagami (Sony SS) VLD2017-122
As a method of reducing the power consumption of the flip-flop circuit, there is a nonvolatile flip-flop (NVFF) that ena... [more] VLD2017-122
pp.199-204
SDM, ICD, ITE-IST [detail] 2017-07-31
11:15
Hokkaido Hokkaido-Univ. Multimedia Education Bldg. [Invited Talk] A Cross Point Cu-ReRAM with a Novel OTS Selector for Storage Class Memory Applications
Shuichiro Yasuda, Kazuhiro Ohba, Tetsuya Mizuguchi, Hiroaki Sei, Masayuki Shimuta, Katsuhisa Aratani, Tsunenori Shiimoto, Tetsuya Yamamoto, Takeyuki Sone, Seiji Nonoguchi, Jun Okuno, Akira Kouchiyama, Wataru Otsuka, Keiichi Tsutsui (Sony Semiconductor Solutions) SDM2017-34 ICD2017-22
(To be available after the conference date) [more] SDM2017-34 ICD2017-22
pp.17-20
IMQ 2017-05-19
13:30
Tokyo Seikei Univ. Report on Image Quality and System Performance XIV
Toshiya Nakaguchi (Chiba Univ.), Mitsuru Maeda (Canon), Shinichiro Saito (Sony) IMQ2017-1
Image Quality and System Performance (IQSP) is held at Electronic Imaging, which is an annual comprehensive internationa... [more] IMQ2017-1
pp.1-7
ICD 2017-04-21
14:15
Tokyo   [Invited Talk] A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) ICD2017-18
 [more] ICD2017-18
pp.95-98
SDM 2016-10-26
14:00
Miyagi Niche, Tohoku Univ. [Invited Talk] Controlling Metallic Contamination in Advanced ULSI Processing
Koichiro Saga (Sony) SDM2016-69
Metal impurities dissolved in silicon can cause “recombination centers”, which degrade retention characteristics of DRAM... [more] SDM2016-69
pp.1-8
ICD, SDM, ITE-IST [detail] 2016-08-01
09:15
Osaka Central Electric Club [Invited Talk] Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions) SDM2016-48 ICD2016-16
This presentation introduces the evolution of image sensors and the future prospect of sensing applications utilizing th... [more] SDM2016-48 ICD2016-16
p.1
ICD, SDM, ITE-IST [detail] 2016-08-01
15:25
Osaka Central Electric Club [Invited Lecture] A 0.7V 1.5-to-2.3mW GNSS Receiver with 2.5-to-3.8dB NF in 28nm FD-SOI
Ken Yamamoto, Kenichi Nakano, Gaku Hidai, Yuya Kondo, Hitoshi Tomiyama, Hideyuki Takano, Fumitaka Kondo, Yusuke Shinohe, Hidenori Takeuchi, Nobuhisa Ozawa (SSS), Shingo Harada, Shinichiro Eto, Mari Kishikawa, Daisuke Ide, Hiroyasu Tagami (Sony LSI Design) SDM2016-52 ICD2016-20
 [more] SDM2016-52 ICD2016-20
pp.45-48
ED 2014-08-01
14:45
Tokyo Kikai-Shinko-Kaikan Bldg. B3-1 Improvement of Off-State Characteristics with a P-Type Capping Layer in GaAs JPHEMT
Katsuhiko Takeuchi, Satoshi Taniguchi, Masashi Yanagita (Sony), Yuji Sasaki, Mitsuhiro Nakamura (Sony Semiconductor), Shinichi Wada (Sony) ED2014-58
Due to its low insertion loss and the high linearity, the JPHEMT is widely used for RF switches in wireless communicatio... [more] ED2014-58
pp.29-34
SDM 2014-01-29
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Three-dimensional Structures for High Saturation Signals and Crosstalk Suppression in 1.20 μm Pixel Back-Illuminated CMOS Image Sensor
Takekazu Shinohara, Kazufumi Watanabe (Sony Semiconductor), Kazunobu Ohta (Sony), Hajime Nakayama (Sony Semiconductor), Takafumi Morikawa (Sony), Keiichi Ohno, Dai Sugimoto (Sony Semiconductor), Shingo Kadomura, Teruo Hirayama (Sony) SDM2013-146
We propose two technologies, vertical transfer gate (VTG) and buried shielding metal (BSM), that can be applied to 1.20 ... [more] SDM2013-146
pp.47-50
ICD, SDM 2012-08-03
14:50
Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido [Invited Talk] A 1V 357Mb/s-Throughput TransferJet(TM) SoC with Embedded Transceiver and Digital Baseband in 90nm CMOS
Masahisa Tamura, Fumitaka Kondo, Katsumi Watanabe, Yasunori Aoki, Yusuke Shinohe, Koki Uchino, Yuhei Hashimoto, Fumihiro Nishiyama, Hiroaki Miyachi (Sony), Ikuho Nagase, Itaru Uezono, Rie Hisamura (Sony Semiconductor), Itaru Maekawa (Sony) SDM2012-85 ICD2012-53
The first SoC for TransferJet(TM) which integrates PHY including an RF transceiver with balun and T/R switch, Connection... [more] SDM2012-85 ICD2012-53
pp.121-125
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