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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMT, EST, LQE, MWP, OPE, PEM, PN, IEE-EMT [detail] |
2018-01-26 11:10 |
Hyogo |
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Current Status of International Standardization of Electric-field Measurement System Using Optical Electric-field Sensor Michitaka Ameya, Satoru Kurokawa (AIST), Yoshikazu Toba (SEIKOH GIKEN), Yoshihiro Imajo, Koji Uematsu (Stack electronics) |
[more] |
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MWP, OPE, EMT, MW, EST, IEE-EMT [detail] |
2017-07-20 09:00 |
Hokkaido |
Obihiro Chamber of Commerce and Industry |
[Invited Talk]
Application of RoF technique in V/UHF band and some problems for next generation wireless communications Yoshihiro Imajo (Stack Electronics) EMT2017-6 MW2017-31 OPE2017-11 EST2017-8 MWP2017-8 |
RoF technology is efficient RF signal transmission method using optical fiber. It is receiving a lot of attention as one... [more] |
EMT2017-6 MW2017-31 OPE2017-11 EST2017-8 MWP2017-8 pp.1-4 |
PEM (2nd) |
2015-11-27 - 2015-11-28 |
Kyoto |
Doshisha Univ. |
[Poster Presentation]
Electric field sensing with EO probe and application of RoF Koji Uematsu, Yoshihiro Imajo, Hiroshi Noguchi (Stack Elec.) |
We present our products, an electric field sensor utilizing electro-optic (EO) effect and device applied to radio over f... [more] |
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PEM (2nd) |
2015-02-12 - 2015-02-13 |
Tokushima |
Hotel Senshukaku |
Electric field sensing with a wide band Electro-Optic effect probe Yoshihiro Imajo, Koji Uematsu, Hiroshi Noguchi (Stack Electronics), Isao Morohashi, Norihiko Sekine, Iwao Hosako (NICT) |
It is expected that electric field probe using EO crystal as a sensor has a extremely wideband frequency response.
We ... [more] |
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CAS, NLP |
2005-09-15 15:00 |
Niigata |
Nagaoka Univ. of Technology |
Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew Zhangcai Huang (Waseda Univ.), Atsushi Kurukawa (STAC), Yasuaki Inoue (Waseda Univ.) |
In deep submicron designs, predicting
gate slews and delays for interconnect loads is vitally
important for Static Tim... [more] |
CAS2005-31 NLP2005-44 pp.31-36 |
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