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Committee
Date Time
Place
Paper Title / Authors
Abstract
Paper #
MBE
2007-01-26
14:20
Kagoshima
Kagoshima-Shichoson-Jichi-Kaikan Bldg.
A Study of noise reduction of CMOS image sensor uisng CNN
Hiroaki Murakami
(
Waseda Univ.
),
Nobuo Nakamura
(
SLSI
),
Toshihiro Nishimura
(
Waseda Univ.
)
It is well known major of two noise which are generated by CMOS Image Senor, Fixed Pattern Noise and Random Noise. In th...
[more]
MBE2006-108
pp.49-52
IE
,
ITE-BCT
,
ITE-AIT
,
ITE-ME
2006-11-30
13:55
Fukuoka
A study of noise reduction of CMOS image sensor using CNN
Hiroaki Murakami
(
Waseda Univ.
),
Nobuo Nakamura
(
SLSI
),
Toshihiro Nishimura
,
Masahito Takaichi
(
Waseda Univ.
)
[more]
IE2006-96
pp.5-8
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