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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| OME | 2020-01-24 14:00 |
Ishikawa | Shiinoki-Geihinkan (Kanazawa) | Visible light photocatalyst based on organic photovoltaic cell Keiji Nagai (Tokyo Tech), Takayuki Kuwabara (Kanazawa Univ.), Mohd Fairus Ahmad (UniMAP), Masahiro Nakano, Makoto Karakawa, Tetsuya Taima, Kohshin Takahashi (Kanazawa Univ.), Toshiyuki Abe (Hirosaki Univ.)  OME2019-60 |
Photocatalytic and photoelectrochemical redox was observed in active layers of photovoltaic cell such as PCBM:P3HT/ZnO,... [more] | OME2019-60 pp.5-8 |
| AP (2nd) |
2017-01-26 - 2017-01-27 |
Overseas | Malaysia-Japan International Institute of Technology (MJIIT) | Approximation of Dielectric Properties Using Polynomial Fit in Microwave Tomography Latifah Mohamed (UniMAP), Ono Yuki, Yoshihiko Kuwahara (Shizuoka Univ.) |
The Finite Difference Time Domain (FDTD) is the most widely used numerical modeling technique to model the propagation o... [more] | |
| OFT | 2010-01-21 17:25 |
Okinawa | Basic study of 3D-CSP module for 10 Gbps Ooptical Access System
-- Module fabrication and its Transmitter/Receiver characteristics -- Ken'ichi Tanaka, Yasunobu Matsuoka, Kazuhiko Hosomi, Misuzu Sagawa, Toshiki Sugawara (Hitachi, CRL), Yukio Sakikawa, Toshiaki Takai, Shohei Hata (Hitachi, PERL.) OFT2009-75 |
We propose 3 Dimension Chip Scale Package(3D-CSP) Bi-directional optical module, as a very small interface with a simple... [more] | OFT2009-75 pp.73-76 |
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| EMCJ | 2010-01-22 09:05 |
Okinawa | University of the Ryukyus | Low-Noise System Design for Electrostatic Deflection of Electron-beam Wen Li, Masami Makuuchi, Kengo Imagawa (PERL,HITACHI), Hiroyuki Takahashi, Yuusuke Ominami, Yasuhiro Gunji (Hitachi High-Technologies) EMCJ2009-111 |
High resolution beam control technology has been required from ion or electron beam lithography, inspection apparatus, m... [more] | EMCJ2009-111 pp.75-80 |
| DC, CPSY | 2008-04-23 15:00 |
Tokyo | Tokyo Univ. | Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems Eishi Ibe (PERL) CPSY2008-7 DC2008-7 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicon... [more] |
CPSY2008-7 DC2008-7 pp.37-42 |
| ICD | 2008-04-18 11:15 |
Tokyo | [Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] | ICD2008-10 pp.51-56 |
|
| PRMU | 2006-09-08 13:20 |
Fukuoka | LSI wafer inspection method using recursive splitting of feature space Kaoru Sakai, Shunji Maeda (HPERL) |
[more] | PRMU2006-69 pp.65-72 |
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| ICD, CPM | 2005-09-08 09:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Development of Design Techniques for Semiconductor-Package By using Simplified DRAM Macro Model of Power System Satoshi Nakamura, Takashi Suga (Hitachi PERL), Mitsuaki Katagiri, Yoji Nishio, Seiji Funaba, Yukitoshi Hirose, イサ サトシ (Elpida) |
In late years, MCP(Multi Chip Package) and SiP(System in Package) which has plural semiconductor chips in one package be... [more] | CPM2005-87 ICD2005-97 pp.13-18 |
| ICD, CPM | 2005-01-27 13:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analysis method of LSI open failure point Yasumaro Komiya, Shuji Kikuchi (PERL), Akira Shimase, Kazuya Mukogawa (Renesas) |
For the purpose of locating an open-failure point in recent LSIs of higher integration, we propose an analysis technique... [more] | CPM2004-155 ICD2004-200 pp.1-6 |
| PRMU | 2004-12-17 09:00 |
Oita | Succesive Classification by Test Feature Classifier and its Application to Dynamic Recognition problems Yukinobu Sakata, Shun'ichi Kaneko, Takayuki Tanaka (Hokkaido Univ.), Yuji Takagi (Hitachi Ltd) |
[more] | PRMU2004-138 pp.25-30 |
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