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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:55 |
Miyazaki |
NewWelCity Miyazaki |
A study on path selection results of an adaptive field test with process variation and aging degradation for VLSI Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyu Univ) VLD2011-85 DC2011-61 |
It has the problem that good VLSIs in production testing become defective VLSIs in the fields because small delays on si... [more] |
VLD2011-85 DC2011-61 pp.191-195 |
DC |
2011-02-14 11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An Analysis of Critical Paths for Field Testing with Process Variation Consideration Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) DC2010-61 |
Recently, it has the problem that good VLSIs in production testing become defective VLSIs in the fields because small de... [more] |
DC2010-61 pp.13-19 |
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