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 Results 1 - 20 of 32  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
MSS, SS 2021-01-26
Online Online An Implementation of Text-classification Based Fault-prone Module Detection and Its Application to Industrial Environment
Osamu Mizuno, Osamu Mizuno (Kyoto Inst. Tech.), Kazuhiro Ishihara (Valtes), Daisuke Yamashita (Valtes Mobile Tech.) MSS2020-32 SS2020-17
In the software development, early detection of software defects
(bugs) contributes to mitigate the development effort ... [more]
MSS2020-32 SS2020-17
MSS, SS 2021-01-26
Online Online An Investigation of Discussion Span in Open Source Projects
Masanari Kondo (Kyoto Inst. Tech.), Shinobu Saito, Yukako Iimura (NTT SIC), Eunjong Choi, Osamu Mizuno (Kyoto Inst. Tech.) MSS2020-33 SS2020-18
To remedy the lack of human resources in software development in companies, we can use crowdsourcing and inner source to... [more] MSS2020-33 SS2020-18
Tokyo Fukutake Learning Theater, Hongo Campus, Univ. Tokyo [Poster Presentation] Utilization of convolutional neural network for the fabrication processes of semiconductor nanostructures
Tomoki Tanoue, Kyoko Kitamura (Kyoto Inst. Tech.), Masahiro Yoshida, Kohei Suenaga, Kenji Ishizaki, Susumu Noda (Kyoto Univ.)
Photonic-crystal laser is a surface-emitting semiconductor laser which possesses semiconductor nanostructures (photonic ... [more]
EMT, EST, LQE, MWP, OPE, PEM, PN, IEE-EMT [detail] 2018-01-25
Hyogo   Coupling control of grating coupler with waveguide resonator
Kazuki Mori, Ryo Tsujimoto, Akira Shimatani, Junichi Inoue (Kyoto Inst. Tech.), Kenji Kintaka (AIST), Shogo Ura (Kyoto Inst. Tech.) PN2017-51 EMT2017-88 OPE2017-129 LQE2017-111 EST2017-87 MWP2017-64
 [more] PN2017-51 EMT2017-88 OPE2017-129 LQE2017-111 EST2017-87 MWP2017-64
SDM 2017-11-09
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] SISPAD 2017 Review (1)
Akira Hiroki (Kyoto Inst. Tech.) SDM2017-62
 [more] SDM2017-62
MSS, SS 2017-01-26
Kyoto Kyoto Institute of Technology Analysis on effort datasets by causal-effect relationship using LiNGAM
Masanari Kondo, Osamu Mizuno (Kyoto Inst. Tech.) MSS2016-57 SS2016-36
The effort estimation is an important task in the software development. Previous research works proposed models using m... [more] MSS2016-57 SS2016-36
MSS, SS 2017-01-27
Kyoto Kyoto Institute of Technology Identifying programming languages from code snippets using convolutional neural network
Kentaro Tanaka, Osamu Mizuno (Kyoto Inst. Tech.) MSS2016-78 SS2016-57
 [more] MSS2016-78 SS2016-57
MW 2016-12-15
Kanagawa National Defense Academy Enhancement of Phase Shifting Nonreciprocity in Composite Right/Left-Handed Microstrip-Lines
Kazuhiro Yoshida, Tetsya Ueda (Kyoto Inst. Tech.), Tatsuo Itoh (UCLA) MW2016-148
Nonreciprocal CRLH metamaterials can have unidirectional wavenumber vectors independent of transmitted power directions.... [more] MW2016-148
SS 2016-03-10
Okinawa   Analysis on Semantic Orientation of Source Code
Akihisa Yamada, Osamu Mizuno (Kyoto Inst. Tech.) SS2015-77
Sentiment analysis is becoming popular in research area of natural language processing. In this paper, we analyze relati... [more] SS2015-77
SS 2016-03-10
Okinawa   Using Word2Vec in Localizing Relevant Files for Bug Reports
Yukiya Uneno, Osamu Mizuno (Kyoto Inst. Tech.), Eun-Hye Choi (AIST) SS2015-85
Once a fault in software is reported, developers have to determine which source files are related to the fault. This pro... [more] SS2015-85
SS 2016-03-11
Okinawa   A Prioritization of Combinatorial Testing Using Bayesian Inference
Shunya Kawabata (Kyoto Inst. Tech.), Eun-Hye Choi (AIST), Osamu Mizuno (Kyoto Inst. Tech.) SS2015-95
An ideal testing detects a large number of faults with a small number of test cases.
Combinatorial testing, which focus... [more]
SS 2015-03-09
Okinawa OKINAWAKEN SEINENKAIKAN An Approach for Abbreviated Identifier Expansion with Machine Learning
Hideki Okajima, Osamu Mizuno (Kyoto Inst. Tech.) SS2014-68
The readability of source code is a crucial factor on software development and maintenance. Identifier is a essential cl... [more] SS2014-68
ICD, CPSY 2014-12-02
Tokyo Kikai-Shinko-Kaikan Bldg. Measurements and Evaluations of Aging Degradation Caused by Plasma Induced Damage in 65 nm Process
Ryo Kishida, Azusa Oshima, Kazutoshi Kobayashi (Kyoto Inst. Tech.) ICD2014-106 CPSY2014-118
Degradations of reliability caused by plasma induced damage (PID) have become a significant concern with miniaturizing a... [more] ICD2014-106 CPSY2014-118
OME, OPE 2014-11-21
Tokyo   Polarization mixing in organic single crystal microcavity
Kenichi Yamashita, Kaname Gotoh, Takashi Hayakawa, Takeshi Yamao, Shu Hotta (Kyoto Inst. Tech.), Hisao Yanagi (NAIST) OME2014-57 OPE2014-137
 [more] OME2014-57 OPE2014-137
EMD, LQE, OPE, CPM, R 2014-08-22
Hokkaido Otaru Economy Center Realization of GaAs1-xBix laser diodes with low temperature dependence of oscillation wavelength
Takuma Fuyuki, Kenji Yoshida, Ryo Yoshioka, Masahiro Yoshimoto (Kyoto Inst. Tech.) R2014-40 EMD2014-45 CPM2014-60 OPE2014-70 LQE2014-44
The coherent epitaxial growth GaAs1-xBix (x = 9.5%) films on GaAs substrate with high optical quality was achieved grown... [more] R2014-40 EMD2014-45 CPM2014-60 OPE2014-70 LQE2014-44
MW 2013-11-21
Kagoshima Kagoshima Prefectural Culture Center [Special Talk] Report on 2013 IEEE MTT-S International Microwave Symposium
Masataka Ohira (Saitama Univ.), Tetsuya Ueda (Kyoto Inst. Tech.), Hiroshi Okazaki (NTT DOCOMO), Eigo Kuwata (Mitsubishi Electric Corp.), Hiroyuki Takahashi (NTT), Shotaro Nagai (Yamaguchi Univ.), Zhewang Ma (Saitama Univ.), Shingo Yamanouchi (NEC) MW2013-140
This is a report on 2013 IEEE MTT-S International Microwave Symposium (IMS 2013) held at Seattle, WA, USA, on June 2-7, ... [more] MW2013-140
PN, EMT, LQE, OPE, MWP, EST, IEE-EMT [detail] 2013-01-25
Osaka Osaka Univ. (Suita) A compound of RGB-splitter and condensers for compact image sensor
Tadayuki Hirano, Naoko Shimatani (Kyoto Inst. Tech.), Kenji Kintaka (AIST), Kenzo Nishio, Yasuhiro Awatsuji, Shogo Ura (Kyoto Inst. Tech.) PN2012-51 OPE2012-160 LQE2012-152 EST2012-87 MWP2012-69
A compound of a color splitting blazed grating and a condenser microlens array is discussed for an improvement of the op... [more] PN2012-51 OPE2012-160 LQE2012-152 EST2012-87 MWP2012-69
Ehime Ehime Univ. Field Experiment on Effect of Received Data Sharing in Multi-hop Cooperative Communications
Makoto Miyagoshi, Hidekazu Murata, Susumu Yoshida, Koji Yamamoto (Kyoto Univ.), Daisuke Umehara (Kyoto Inst. Tech.), Satoshi Denno (Okayama Univ.), Masahiro Morikura (Kyoto Univ.) NS2012-122 RCS2012-197
Multi-hop cooperative communications systems consist of a source, a destination, and several relays in each hop. When pr... [more] NS2012-122 RCS2012-197
pp.31-36(NS), pp.83-88(RCS)
SDM 2012-12-07
Kyoto Kyoto Univ. (Katsura) Depth analysis of ultra-shallow junctions by photoluminescence with the aid of nano-scale wet etching
Gota Murai, Masashi Okutani, Syuji Tagawa, Masahiro Yoshimoto (Kyoto Inst. Tech.), Woo Sik Yoo (WaferMasters) SDM2012-127
The photoluminescence (PL) intensity at room temperature increased with decreasing defect density measured by DLTS(deep ... [more] SDM2012-127
(Joint) [detail]
Fukuoka Centennial Hall Kyushu University School of Medicine Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation
Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2012-70 DC2012-36
Designing reliable systems has become more difficult in recent years.
In this paper, statistical nature of RTN-induced ... [more]
VLD2012-70 DC2012-36
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