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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ISEC | 2024-05-15 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
All You Need Is Fault: Zero-Value Attacks on AES and a New lambda-Detection M&M (from TCHES 2024) Haruka Hirata, Daiki Miyahara (UEC), Victor Arribas (Rambus/KUL), Yang Li (UEC), Noriyuki Miura (Osaka Univ.), Svetla Nikova (KUL), Kazuo Sakiyama (UEC) |
[more] | |
| MSS, SS | 2023-01-10 13:30 |
Osaka | (Primary: On-site, Secondary: Online) |
[Invited Talk]
Thermal Comfort Aware Online Energy Management Framework for Smart Building: An Experimental Study Daichi Watari, Ittetsu Taniguchi (Osaka Univ.), Francky Catthoor (IMEC/KUL), Charalampos Marantos (NTUA), Kostas Siozios (AUTH), Elham Shirazi (UT), Dimitrios Soudris (NTUA), Takao Onoye (Osaka Univ.)  MSS2022-45 SS2022-30 |
This report presents a real-time energy management system for buildings that uses solar power generation and thermal com... [more] | MSS2022-45 SS2022-30 pp.5-6 |
| HWS (2nd) |
2018-12-13 16:10 |
Tokyo | Tokyo Univ. Takeda Bldg. Takeda Hall | [Poster Presentation]
Fundamental Study on Randomness Evaluation Method of True Random Number Generator Using Amplitude Probability Distribution Saki Osuka, Daisuke Fujimoto (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven), Yu-ichi Hayashi (NAIST) |
(Advance abstract in Japanese is available) [more] | |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
Fundamental Study on Degradation of Randomness in TRNG Due to Intentional Electromagnetic Interference Saki Osuka, Daisuke Fujimoto (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven), Yu-ichi Hayashi (NAIST) EMCJ2018-66 |
Attacks that degrade the randomness of a true random number generator (TRNG) by physical attacks on entropy sources, whi... [more] | EMCJ2018-66 pp.35-36 |
| HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] | 2018-07-25 14:25 |
Hokkaido | Sapporo Convention Center | Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 |
Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported.... [more] | ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 pp.77-81 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
| ICSS | 2014-11-27 15:35 |
Miyagi | Tohoku Gakuin University (Tagajo Campus) | On the status of techniques and standardization regarding lightweight cryptography
-- ISO/IEC JTC1/SC27/WG2 status report -- Hirotaka Yoshida, Dai Watanabe (Hitachi), Nicky Mouha (KU Leuven) ICSS2014-55 |
As more and more computers and controllers used for ICS (industrial control systems) or for vehicles go online, increase... [more] | ICSS2014-55 pp.25-30 |
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