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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 12件中 1~12件目  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2020-02-07
10:10
Tokyo Tokyo University-Hongo [Invited Talk] Stability of Cu Interconnect Surface after post CMP Cleaning
Yasuhiro Kawase, Toshiaki Shibata, Tomohiro Kusano (MCC), Ken Harada (imec), Kan Takeshita (MCC) SDM2019-90
At present, more than 12 Cu interconnect layers have been formed in advanced semiconductor devices and each layer is pla... [more] SDM2019-90
pp.9-14
HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] 2018-07-25
14:25
Hokkaido Sapporo Convention Center Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection
Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19
Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported.... [more] ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19
pp.77-81
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:30
Osaka Ritsumeikan University, Osaka Ibaraki Campus Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]
VLD2016-52 DC2016-46
pp.49-54
SDM 2016-01-22
16:00
Tokyo Sanjo Conference Hall, The University of Tokyo [Invited Talk] Packaging Material for 2.5D/3D TSV Integration
Kazuyuki Mitsukura, Tatsuya Makino, Keiichi Hatakeyama (Hitachi Chemical), Kenneth June Rebibis, Andy Miller, Eric Beyne (IMEC) SDM2015-118
 [more] SDM2015-118
pp.45-47
ICD, CPSY 2015-12-17
09:40
Kyoto Kyoto Institute of Technology RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayash (KIT), Hidetoshi Onodera (KU) ICD2015-63 CPSY2015-76
 [more] ICD2015-63 CPSY2015-76
pp.1-6
ICD, CPSY 2015-12-17
16:00
Kyoto Kyoto Institute of Technology [Poster Presentation] RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU)
 [more]
EE, WPT, IEE-SPC
(Joint) [detail]
2015-07-06
15:30
Kyoto   Application of Wireless Electromagnetic Resonance Power Transmission Technology to Rotary Transformer Used in Ultrasonic Spindle
Yafei Gao, Myoungsik Nam, Masahito Shoyama (Kyushu Univ.), Hideaki Fujita (Oriimec) WPT2015-39
Rotary transformer is used to supply power to non-contact ultrasonic spindle. For solving the problem that low voltage c... [more] WPT2015-39
pp.19-23
EE, WPT
(Joint)
2014-11-19
14:55
Kyoto Doshisha University Application of Wireless Electromagnetic Resonance Technology to Rotary Transformer Used in Ultrasonic Spin Drill
Yuki Inoue, Yafei Gao, Masahito Shoyama (Kyushu Univ.), Hideaki Fujita (Oriimec) EE2014-26
 [more] EE2014-26
pp.43-48
SANE 2013-12-02
15:50
Overseas VAST/VNSC(2nd Dec.) & Melia Hotel (3rd Dec), Hanoi, Vietnam Analysis of thermal responses for a satellite with two-node model using the equivalent linearization technique
Nguyen Dong Anh, Nguyen Nhu Hieu (IMECH., VAST), Pham Ngoc Chung (Hanoi Uni. Min.&Geo.) SANE2013-90
 [more] SANE2013-90
pp.109-114
SDM 2013-02-04
16:05
Tokyo Kikai-Shinko-Kaikan Bldg. Novel Seed Layer Formation Using Electroless Copper Deposition For High Aspect Ratio TSV
Fumihiro Inoue, Shoso Shingubara (Kansai Univ.), Harold Philipsen (IMEC) SDM2012-156
 [more] SDM2012-156
pp.31-34
US, EA
(Joint)
2013-01-24
11:00
Kyoto Kambaikan, Doshisha Univ. Gas Concentration Measurement Using Ultrasonic
Hiroaki Fukuoka, Sekiyo Katsu, Yoshimine Kato, Masahiro Inoue (Kyushu Univ.), Hideaki Fujita (Oriimec Corp.) US2012-89
Gas concentrations was successfully measured using the ultrasonic velocity difference. Each gas has its own specific val... [more] US2012-89
pp.7-12
ICD, SDM 2012-08-02
14:40
Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido Intra/Inter Tier Substrate Noise Measurements in 3D ICs
Yasumasa Takagi, Yuuki Araga, Makoto Nagata (Kobe Univ.), Geert Van der Plas, Jaemin Kim, Nikolaos Minas, Pol Marchal, Michael Libois, Antonio La Manna, Wenqi Zhang, Julien Ryckaert, Eric Beyne (IMEC) SDM2012-72 ICD2012-40
Substrate noise propagation among stacked dice is evaluated in a 3D test vehicle of 2 tier stacking. Each tier incorpora... [more] SDM2012-72 ICD2012-40
pp.49-54
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