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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2013-01-10
16:25		 Nagasaki Nagasaki Univ. Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable
Kenich Yano, Nobuo Kuwabara (KIT), Toshiki Shimasaki (NEC-E), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA) EMCJ2012-113		  [more] EMCJ2012-113
pp.63-68
EMCJ, EMD 2012-07-20
15:30		 Tokyo Kikai-Shinko-Kaikan Bldg. Study of correlation between kit-module level and electric field strength by using SO-DIMM evaluation model
Nobuo Kuwabara (KIT), Hirokazu Tohya (ICAST), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA DEVIC), Toshiki Shimasaki (NEC Engineering) EMCJ2012-47 EMD2012-22		  [more] EMCJ2012-47 EMD2012-22
pp.37-42
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